Automated Linear System Parameter Identification Using Successive Differentiation and its Application in Microprocessor Controlled C and Tan δ Measurement

Automated Linear System Parameter Identification Using Successive Differentiation and its Application in Microprocessor Controlled C and Tan δ Measurement

A new algorithm is suggested for linear system parameter identification, which lends itself easily to implementation using microprocessors. The main feature of this algorithm is that it is based on the estimation of the values of the successive derivatives of the input and output variables. This new...

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Veröffentlicht in:IEEE transactions on industrial electronics (1982) 1984-05, Vol.IE-31 (2), p.137-140
Hauptverfasser: Selim, Hany, Girgis, Girgis A.
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Automatic control
Capacitance measurement
Computer science
control theory
systems
Control systems
Control theory. Systems
Equations
Exact sciences and technology
Frequency
Linear systems
Loss measurement
Microprocessors
Modelling and identification
Parameter estimation
Transfer functions
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Beschreibung
Zusammenfassung:A new algorithm is suggested for linear system parameter identification, which lends itself easily to implementation using microprocessors. The main feature of this algorithm is that it is based on the estimation of the values of the successive derivatives of the input and output variables. This new algorithm was successfully used to measure unknown capacitances and inductances together with their loss angles using the TMS9980A microprocessor.
ISSN:0278-0046
1557-9948
DOI:10.1109/TIE.1984.350057