A Numerical Study of Roughness Scale Effects on Ocean Radar Scattering Using the Second-Order SSA and the Moment Method

The roughness scale effects on ocean radar scattering are studied using the second-order small slope approximation (SSA-II) and the method of moments (MoM). The KHCC03 spectrum is employed to represent 2-D and 1-D sea surfaces in the above two scattering methods, respectively. Criteria of full spect...

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Veröffentlicht in:IEEE transactions on geoscience and remote sensing 2020-10, Vol.58 (10), p.6874-6887
Hauptverfasser: Du, Yanlei, Yin, Junjun, Tan, Shurun, Wang, Jing, Yang, Jian
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Sprache:eng
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Zusammenfassung:The roughness scale effects on ocean radar scattering are studied using the second-order small slope approximation (SSA-II) and the method of moments (MoM). The KHCC03 spectrum is employed to represent 2-D and 1-D sea surfaces in the above two scattering methods, respectively. Criteria of full spectrum truncation are proposed for the numerical simulations of ocean scattering. Numerical results are illustrated in fully bistatic configuration at L- and C-bands. It is found that scattering at higher frequency is relatively more sensitive to the small-scale roughness but less sensitive to the large-scale roughness. At L- and C-bands, short waves with wavenumber larger than 316 rad/m have little effect on ocean scattering. The large-scale waves put more impacts on scattering in the forward directions, especially for large incidence angles. Other than the specular direction, the effects of large-scale roughness on ocean scattering are in general smaller at VV-pol than HH-pol. The bistatic scattering at cross polarizations is less sensitive to the roughness scale as compared to the copolarizations. For numerical simulations of ocean scattering with incidence angle less than 60°, using small surface profiles with size about 1/6 of those accounting for full spectrum yields results with errors less than 2 dB. Results also indicate that the incoherent parts dominate the scattered power from ocean surfaces with large-scale roughness.
ISSN:0196-2892
1558-0644
DOI:10.1109/TGRS.2020.2977368