Statistical Eye-Diagram Estimation Method Considering Power/Ground Noise Induced by Simultaneous Switching Output (SSO) Buffers

In this article, we propose a novel statistical eye-diagram estimation method considering nonlinear power/ground noise induced by parallel simultaneous switching output (SSO) buffers. Probability density functions (pdfs) of output step-responses affected by the SSO are derived based on the occurrence probability of each SSO pattern. From the derived output response pdfs, main-cursor (MC) pdfs and intersymbol interference (ISI) pdfs are defined. Statistical output responses are derived based on recursive convolution between the MC-pdfs and ISI-pdfs affecting each other. The proposed method, for the first time, considers steady-state responses affected by the SSO to estimate more accurate statistical eye-diagrams. The proposed method is verified by comparing the derived statistical eye-diagrams with eye diagrams obtained using full transient simulation. Also, bit error rate (BER) bathtub curves derived using the proposed method and full transient simulation are compared for verification. The proposed method is compared with the previous study to emphasize importance of the steady-state responses. Finally, the proposed method is expanded to consider previous bit patterns, which are also affected by the SSO.