EMI Susceptibility Model of Signal Conditioning Circuits Based on Operational Amplifiers

EMI Susceptibility Model of Signal Conditioning Circuits Based on Operational Amplifiers

Circuits based on operational amplifiers (OPAMPs) are susceptible to electromagnetic interference (EMI) in the radio-frequency range due to the AM demodulation produced by non-linearity of internal transistors. Such a phenomenon produces demodulated signals in the low-frequency range. This paper pre...

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Veröffentlicht in:IEEE transactions on electromagnetic compatibility 2007-11, Vol.49 (4), p.849-859
Hauptverfasser: Gago, J., Balcells, J., Gonzalez, D., Lamich, M., Mon, J., Santolaria, A.
Format: Artikel
Sprache:eng
Schlagworte:
Amplifiers
Applied sciences
Circuit properties
Circuits
Demodulation
Electrets
Electric, optical and optoelectronic circuits
Electromagnetic compatibility
Electromagnetic interference
Electromagnetic interference (EMI)
Electronic circuits
Electronics
Exact sciences and technology
Information, signal and communications theory
Instrumentation
Mathematical models
Modulation, demodulation
operational amplifier (OPAMP)
Operational amplifiers
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Signal and communications theory
susceptibility
Telecommunications and information theory
Transistors
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Zusammenfassung:Circuits based on operational amplifiers (OPAMPs) are susceptible to electromagnetic interference (EMI) in the radio-frequency range due to the AM demodulation produced by non-linearity of internal transistors. Such a phenomenon produces demodulated signals in the low-frequency range. This paper presents a model to predict the susceptibility of analog signal-conditioning circuits, based on a few test parameters, while ignoring the internal structure of OPAMPs involved in the circuit. The method has been experimentally tested in two applications: (1) test of simple instrumentation adapter circuits and (2) predictions of susceptibility of an amplifier for an electret microphone, tested according to EN55020.
ISSN:0018-9375
1558-187X
DOI:10.1109/TEMC.2007.908845