Electrical Performance Determination and Stress Reliability Estimation of ALD- Derived Er 2 O 3 /InP Heterointerface

Electrical Performance Determination and Stress Reliability Estimation of ALD- Derived Er 2 O 3 /InP Heterointerface

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Veröffentlicht in:IEEE transactions on electron devices 2023-12, Vol.70 (12), p.6125-6131
Hauptverfasser: Qiao, Lesheng, He, Gang, Jiang, Shanshan, Liu, Yanmei, Lu, Jinyu, Wu, Qiuju, Fang, Zebo
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container_title IEEE transactions on electron devices
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creator Qiao, Lesheng
He, Gang
Jiang, Shanshan
Liu, Yanmei
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Wu, Qiuju
Fang, Zebo
description
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title Electrical Performance Determination and Stress Reliability Estimation of ALD- Derived Er 2 O 3 /InP Heterointerface
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