Self-Heating Characterization and Thermal Resistance Modeling in Multitube CNTFETs

Self-Heating Characterization and Thermal Resistance Modeling in Multitube CNTFETs

The thermal resistance, thermal capacitance, and thermal time constant have been experimentally extracted for the first time for a multi-tube multi-finger carbon nanotube FET (CNTFET) from trap-free high-frequency characteristics by following a methodology based on temperature-dependent two-port net...

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Veröffentlicht in:IEEE transactions on electron devices 2019-11, Vol.66 (11), p.4566-4571
Hauptverfasser: Pacheco-Sanchez, Anibal, Bejenari, Igor, Schroter, Michael
Format: Artikel
Sprache:eng
Schlagworte:
carbon nanotube FET (CNTFET)
Carbon nanotubes
CNTFETs
Heat transfer
Impedance
Logic gates
Network analysis
New technology
self-heating (SH)
Semiconductor device measurement
Stability analysis
Temperature dependence
Thermal analysis
thermal capacitance
Thermal resistance
Thermal stability
Thermodynamic properties
Time constant
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Beschreibung
Zusammenfassung:The thermal resistance, thermal capacitance, and thermal time constant have been experimentally extracted for the first time for a multi-tube multi-finger carbon nanotube FET (CNTFET) from trap-free high-frequency characteristics by following a methodology based on temperature-dependent two-port network analysis. The extracted short thermal time constant confirms the thermal stability for this emerging technology. A lumped-element electro-thermal model for multi-tube CNTFETs has been developed and proven with experimental data.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2019.2942783