Transient Analysis for Electrothermal Properties in Nanoscale Transistors

Due to the significance of electron and heat transfer in designing the nanoscale semiconductor devices, the transient analysis of electrothermal properties has attracted extensive attention. In this paper, the density-gradient and dual-phase-lag (DPL) equations are first combined to predict the elec...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on electron devices 2018-09, Vol.65 (9), p.3930-3935
Hauptverfasser: Cheng, Aiqiang, Chen, Shitao, Zeng, Hui, Ding, Dazhi, Chen, Rushan
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Due to the significance of electron and heat transfer in designing the nanoscale semiconductor devices, the transient analysis of electrothermal properties has attracted extensive attention. In this paper, the density-gradient and dual-phase-lag (DPL) equations are first combined to predict the electron and heat transport in nanoscale transistors. The DPL equation is solved with the consideration of the temperature jump boundary condition that dealing with phonon-wall collisions. We have shown that the temporal and spatial distributions of related physical variables can be obtained by self-consistently solving these equations. Furthermore, the spectral element time-domain method is used to discretize these equations. Numerical results of electrothermal properties for both 2-D and 3-D field-effect transistors have been demonstrated to show the robustness and universality of the proposed model. Therefore, the model we proposed can be used with the temporal and spatial distributions, which could be helpful for evaluating the electrothermal performance and computational designing of nanoscale transistors.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2018.2858813