Comprehensive Capacitance–Voltage Simulation and Extraction Tool Including Quantum Effects for High-k on Si x Ge 1− x and In x Ga 1− x As: Part I—Model Description and Validation
Gespeichert in:
Veröffentlicht in: | IEEE transactions on electron devices 2017-09, Vol.64 (9), p.3786-3793 |
---|---|
Hauptverfasser: | , , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 3793 |
---|---|
container_issue | 9 |
container_start_page | 3786 |
container_title | IEEE transactions on electron devices |
container_volume | 64 |
creator | Anwar, Sarkar R. M. Vandenberghe, William G. Bersuker, Gennadi Veksler, Dmitry Verzellesi, Giovanni Morassi, Luca Galatage, Rohit V. Jha, Sumit Buie, Creighton Barton, Adam T. Vogel, Eric M. Hinkle, Christopher L. |
description | |
doi_str_mv | 10.1109/TED.2017.2725645 |
format | Article |
fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TED_2017_2725645</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1109_TED_2017_2725645</sourcerecordid><originalsourceid>FETCH-LOGICAL-c885-6a34522d82611e2ebb6ea63cad451ea2f7e9fc486b3e2267dc95ad85609a51df3</originalsourceid><addsrcrecordid>eNo9kM1OwkAUhSdGExHdu5wXKHamnWnrjgACCUYNhG1zmbmF0f6QmWJwx9K1-jQ-Dk8iILq695zcnHvyEXLN_BZjfnIz6XVb3GdRi0dcyFCckAYTIvISGcpT0vB9FntJEAfn5MK5552UYcgb5LtTFUuLCyydeUXagSUoU0OpcLv5nFZ5DXOkY1OscqhNVVIoNe2tawvqICdVldNhqfKVNuWcPq2grFcF7WUZqtrRrLJ0YOYL74XujseGrmkfKdu-f-y2fdSw3FvwZ7XdLX0EW9PhdvN1X2nMaRedsmb5_3wKudGHLpfkLIPc4dVxNsnkrjfpDLzRQ3_YaY88FcfCkxCEgnMdc8kYcpzNJIIMFOhQMASeRZhkKozlLEDOZaRVIkDHQvoJCKazoEn831hlK-csZunSmgLsW8r8dI8-3aFP9-jTI_rgB9G6fBc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Comprehensive Capacitance–Voltage Simulation and Extraction Tool Including Quantum Effects for High-k on Si x Ge 1− x and In x Ga 1− x As: Part I—Model Description and Validation</title><source>IEEE Electronic Library (IEL)</source><creator>Anwar, Sarkar R. M. ; Vandenberghe, William G. ; Bersuker, Gennadi ; Veksler, Dmitry ; Verzellesi, Giovanni ; Morassi, Luca ; Galatage, Rohit V. ; Jha, Sumit ; Buie, Creighton ; Barton, Adam T. ; Vogel, Eric M. ; Hinkle, Christopher L.</creator><creatorcontrib>Anwar, Sarkar R. M. ; Vandenberghe, William G. ; Bersuker, Gennadi ; Veksler, Dmitry ; Verzellesi, Giovanni ; Morassi, Luca ; Galatage, Rohit V. ; Jha, Sumit ; Buie, Creighton ; Barton, Adam T. ; Vogel, Eric M. ; Hinkle, Christopher L.</creatorcontrib><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/TED.2017.2725645</identifier><language>eng</language><ispartof>IEEE transactions on electron devices, 2017-09, Vol.64 (9), p.3786-3793</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c885-6a34522d82611e2ebb6ea63cad451ea2f7e9fc486b3e2267dc95ad85609a51df3</citedby><cites>FETCH-LOGICAL-c885-6a34522d82611e2ebb6ea63cad451ea2f7e9fc486b3e2267dc95ad85609a51df3</cites><orcidid>0000-0001-5770-6512 ; 0000-0001-7116-0755 ; 0000-0002-5485-6600</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Anwar, Sarkar R. M.</creatorcontrib><creatorcontrib>Vandenberghe, William G.</creatorcontrib><creatorcontrib>Bersuker, Gennadi</creatorcontrib><creatorcontrib>Veksler, Dmitry</creatorcontrib><creatorcontrib>Verzellesi, Giovanni</creatorcontrib><creatorcontrib>Morassi, Luca</creatorcontrib><creatorcontrib>Galatage, Rohit V.</creatorcontrib><creatorcontrib>Jha, Sumit</creatorcontrib><creatorcontrib>Buie, Creighton</creatorcontrib><creatorcontrib>Barton, Adam T.</creatorcontrib><creatorcontrib>Vogel, Eric M.</creatorcontrib><creatorcontrib>Hinkle, Christopher L.</creatorcontrib><title>Comprehensive Capacitance–Voltage Simulation and Extraction Tool Including Quantum Effects for High-k on Si x Ge 1− x and In x Ga 1− x As: Part I—Model Description and Validation</title><title>IEEE transactions on electron devices</title><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNo9kM1OwkAUhSdGExHdu5wXKHamnWnrjgACCUYNhG1zmbmF0f6QmWJwx9K1-jQ-Dk8iILq695zcnHvyEXLN_BZjfnIz6XVb3GdRi0dcyFCckAYTIvISGcpT0vB9FntJEAfn5MK5552UYcgb5LtTFUuLCyydeUXagSUoU0OpcLv5nFZ5DXOkY1OscqhNVVIoNe2tawvqICdVldNhqfKVNuWcPq2grFcF7WUZqtrRrLJ0YOYL74XujseGrmkfKdu-f-y2fdSw3FvwZ7XdLX0EW9PhdvN1X2nMaRedsmb5_3wKudGHLpfkLIPc4dVxNsnkrjfpDLzRQ3_YaY88FcfCkxCEgnMdc8kYcpzNJIIMFOhQMASeRZhkKozlLEDOZaRVIkDHQvoJCKazoEn831hlK-csZunSmgLsW8r8dI8-3aFP9-jTI_rgB9G6fBc</recordid><startdate>201709</startdate><enddate>201709</enddate><creator>Anwar, Sarkar R. M.</creator><creator>Vandenberghe, William G.</creator><creator>Bersuker, Gennadi</creator><creator>Veksler, Dmitry</creator><creator>Verzellesi, Giovanni</creator><creator>Morassi, Luca</creator><creator>Galatage, Rohit V.</creator><creator>Jha, Sumit</creator><creator>Buie, Creighton</creator><creator>Barton, Adam T.</creator><creator>Vogel, Eric M.</creator><creator>Hinkle, Christopher L.</creator><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0001-5770-6512</orcidid><orcidid>https://orcid.org/0000-0001-7116-0755</orcidid><orcidid>https://orcid.org/0000-0002-5485-6600</orcidid></search><sort><creationdate>201709</creationdate><title>Comprehensive Capacitance–Voltage Simulation and Extraction Tool Including Quantum Effects for High-k on Si x Ge 1− x and In x Ga 1− x As: Part I—Model Description and Validation</title><author>Anwar, Sarkar R. M. ; Vandenberghe, William G. ; Bersuker, Gennadi ; Veksler, Dmitry ; Verzellesi, Giovanni ; Morassi, Luca ; Galatage, Rohit V. ; Jha, Sumit ; Buie, Creighton ; Barton, Adam T. ; Vogel, Eric M. ; Hinkle, Christopher L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c885-6a34522d82611e2ebb6ea63cad451ea2f7e9fc486b3e2267dc95ad85609a51df3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Anwar, Sarkar R. M.</creatorcontrib><creatorcontrib>Vandenberghe, William G.</creatorcontrib><creatorcontrib>Bersuker, Gennadi</creatorcontrib><creatorcontrib>Veksler, Dmitry</creatorcontrib><creatorcontrib>Verzellesi, Giovanni</creatorcontrib><creatorcontrib>Morassi, Luca</creatorcontrib><creatorcontrib>Galatage, Rohit V.</creatorcontrib><creatorcontrib>Jha, Sumit</creatorcontrib><creatorcontrib>Buie, Creighton</creatorcontrib><creatorcontrib>Barton, Adam T.</creatorcontrib><creatorcontrib>Vogel, Eric M.</creatorcontrib><creatorcontrib>Hinkle, Christopher L.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Anwar, Sarkar R. M.</au><au>Vandenberghe, William G.</au><au>Bersuker, Gennadi</au><au>Veksler, Dmitry</au><au>Verzellesi, Giovanni</au><au>Morassi, Luca</au><au>Galatage, Rohit V.</au><au>Jha, Sumit</au><au>Buie, Creighton</au><au>Barton, Adam T.</au><au>Vogel, Eric M.</au><au>Hinkle, Christopher L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Comprehensive Capacitance–Voltage Simulation and Extraction Tool Including Quantum Effects for High-k on Si x Ge 1− x and In x Ga 1− x As: Part I—Model Description and Validation</atitle><jtitle>IEEE transactions on electron devices</jtitle><date>2017-09</date><risdate>2017</risdate><volume>64</volume><issue>9</issue><spage>3786</spage><epage>3793</epage><pages>3786-3793</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><doi>10.1109/TED.2017.2725645</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0001-5770-6512</orcidid><orcidid>https://orcid.org/0000-0001-7116-0755</orcidid><orcidid>https://orcid.org/0000-0002-5485-6600</orcidid></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0018-9383 |
ispartof | IEEE transactions on electron devices, 2017-09, Vol.64 (9), p.3786-3793 |
issn | 0018-9383 1557-9646 |
language | eng |
recordid | cdi_crossref_primary_10_1109_TED_2017_2725645 |
source | IEEE Electronic Library (IEL) |
title | Comprehensive Capacitance–Voltage Simulation and Extraction Tool Including Quantum Effects for High-k on Si x Ge 1− x and In x Ga 1− x As: Part I—Model Description and Validation |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T18%3A33%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Comprehensive%20Capacitance%E2%80%93Voltage%20Simulation%20and%20Extraction%20Tool%20Including%20Quantum%20Effects%20for%20High-k%20on%20Si%20x%20Ge%201%E2%88%92%20x%20and%20In%20x%20Ga%201%E2%88%92%20x%20As:%20Part%20I%E2%80%94Model%20Description%20and%20Validation&rft.jtitle=IEEE%20transactions%20on%20electron%20devices&rft.au=Anwar,%20Sarkar%20R.%20M.&rft.date=2017-09&rft.volume=64&rft.issue=9&rft.spage=3786&rft.epage=3793&rft.pages=3786-3793&rft.issn=0018-9383&rft.eissn=1557-9646&rft_id=info:doi/10.1109/TED.2017.2725645&rft_dat=%3Ccrossref%3E10_1109_TED_2017_2725645%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |