AZO Thin Film Transistor Performance Enhancement by Capping an Aluminum Layer

Coplanar bottom-gate aluminum-zinc-oxide (AZO) thin film transistors (TFTs) with aluminum (Al) capping layers were fabricated in this work. The influences of the Al capping layer thickness and the post-annealing condition on the performance of the AZO-TFTs were investigated. Results show that the pe...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on electron devices 2017-05, Vol.64 (5), p.2228-2232
Hauptverfasser: Yu, Wen, Han, Dedong, Dong, Junchen, Cong, Yingying, Cui, Guodong, Wang, Yi, Zhang, Shengdong
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Coplanar bottom-gate aluminum-zinc-oxide (AZO) thin film transistors (TFTs) with aluminum (Al) capping layers were fabricated in this work. The influences of the Al capping layer thickness and the post-annealing condition on the performance of the AZO-TFTs were investigated. Results show that the performance of the AZO-TFTs are enhanced significantly by introducing the Al capping layer on back channel, with saturation mobility increasing dramatically from 0.128 to 12.6 cm 2 /V · s. The enhancement is ascribed to the diffusion of Al atoms into the AZO thin film and thus induced crystallization improvement.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2017.2679107