An Improved Flicker Noise Model for Circuit Simulations

An Improved Flicker Noise Model for Circuit Simulations

Compact flicker noise models used in SPICE circuit simulators are derived from the seminal BSIM unified noise model. In this paper, we show that use of this model can give anomalous bias dependence of input referred noise. In addition, we find that the state-of-the art flicker noise models are not a...

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Veröffentlicht in:IEEE transactions on electron devices 2017-04, Vol.64 (4), p.1689-1694
Hauptverfasser: Roy, Ananda S., Sungwon Kim, Mudanai, Sivakumar P.
Format: Artikel
Sprache:eng
Schlagworte:
1/f noise
Capacitance
compact modeling
Data models
flicker noise
Integrated circuit modeling
Logic gates
Mathematical model
noise
Semiconductor device modeling
SPICE
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Zusammenfassung:Compact flicker noise models used in SPICE circuit simulators are derived from the seminal BSIM unified noise model. In this paper, we show that use of this model can give anomalous bias dependence of input referred noise. In addition, we find that the state-of-the art flicker noise models are not adequate to capture the drain bias dependence of flicker noise in short channel devices. In this paper, we address both the issues with a new compact model.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2017.2669153