Noise Performance of Niobium Nano-SQUIDs in Applied Magnetic Fields
We have fabricated two different designs of niobium dc nano-SQUIDs using focussed ion beam (FIB) lithography with loops and track widths down to 70 nm. We report on the voltage-flux and noise performance of the devices in zero field and with magnetic fields of up to 1 T applied either in-plane or pe...
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 2011-06, Vol.21 (3), p.404-407 |
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| container_title | IEEE transactions on applied superconductivity |
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| creator | Romans, E J Rozhko, S Young, L Blois, A Ling Hao Cox, D Gallop, J C |
| description | We have fabricated two different designs of niobium dc nano-SQUIDs using focussed ion beam (FIB) lithography with loops and track widths down to 70 nm. We report on the voltage-flux and noise performance of the devices in zero field and with magnetic fields of up to 1 T applied either in-plane or perpendicular to the plane at temperatures between 5 K and 9 K. We compare the measurements with modeled estimates of the inductance of the structures and the conventional theory of noise in dc SQUIDs. |
| doi_str_mv | 10.1109/TASC.2010.2090851 |
| format | Article |
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We report on the voltage-flux and noise performance of the devices in zero field and with magnetic fields of up to 1 T applied either in-plane or perpendicular to the plane at temperatures between 5 K and 9 K. We compare the measurements with modeled estimates of the inductance of the structures and the conventional theory of noise in dc SQUIDs.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2010.2090851</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Direct current ; Electrical engineering. Electrical power engineering ; Electromagnets ; Electronics ; Exact sciences and technology ; Inductance ; Magnetic field sensitivity ; Magnetic fields ; Magnetic tunneling ; Microelectronic fabrication (materials and surfaces technology) ; Nanocomposites ; Nanomaterials ; nanoscale SQUID ; Nanostructure ; Niobium ; Noise ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; SQUIDs ; Superconducting devices ; Superconducting magnets ; superconducting quantum interference device ; Superconductivity ; Temperature measurement ; Various equipment and components</subject><ispartof>IEEE transactions on applied superconductivity, 2011-06, Vol.21 (3), p.404-407</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jun 2011</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c355t-8425fe6eff1e0bd646a9408308d42608ff93c1642db1d93cf9c29f712f7ed9a53</citedby><cites>FETCH-LOGICAL-c355t-8425fe6eff1e0bd646a9408308d42608ff93c1642db1d93cf9c29f712f7ed9a53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5659893$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,792,23910,23911,25119,27903,27904,54737</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5659893$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=24275999$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Romans, E J</creatorcontrib><creatorcontrib>Rozhko, S</creatorcontrib><creatorcontrib>Young, L</creatorcontrib><creatorcontrib>Blois, A</creatorcontrib><creatorcontrib>Ling Hao</creatorcontrib><creatorcontrib>Cox, D</creatorcontrib><creatorcontrib>Gallop, J C</creatorcontrib><title>Noise Performance of Niobium Nano-SQUIDs in Applied Magnetic Fields</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>We have fabricated two different designs of niobium dc nano-SQUIDs using focussed ion beam (FIB) lithography with loops and track widths down to 70 nm. We report on the voltage-flux and noise performance of the devices in zero field and with magnetic fields of up to 1 T applied either in-plane or perpendicular to the plane at temperatures between 5 K and 9 K. We compare the measurements with modeled estimates of the inductance of the structures and the conventional theory of noise in dc SQUIDs.</description><subject>Applied sciences</subject><subject>Direct current</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Electromagnets</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Inductance</subject><subject>Magnetic field sensitivity</subject><subject>Magnetic fields</subject><subject>Magnetic tunneling</subject><subject>Microelectronic fabrication (materials and surfaces technology)</subject><subject>Nanocomposites</subject><subject>Nanomaterials</subject><subject>nanoscale SQUID</subject><subject>Nanostructure</subject><subject>Niobium</subject><subject>Noise</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>SQUIDs</subject><subject>Superconducting devices</subject><subject>Superconducting magnets</subject><subject>superconducting quantum interference device</subject><subject>Superconductivity</subject><subject>Temperature measurement</subject><subject>Various equipment and components</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkMFKAzEQhhdRUKsPIF4WQfCymskm2eRYqlVBq9L2HNLdiUR2N2vSHnx7U1o8eJp_mG-G4cuyCyC3AETdLcbzyS0lqaVEEcnhIDsBzmVBOfDDlAmHQlJaHmenMX4RAkwyfpJNZt5FzN8xWB8609eYe5vPnF-5TZfPTO-L-cfy-T7mrs_Hw9A6bPJX89nj2tX51GHbxLPsyJo24vm-jrLl9GExeSpe3h6fJ-OXoi45XxeSUW5RoLWAZNUIJoxiRJZENowKIq1VZQ2C0WYFTYpW1VTZCqitsFGGl6PsZnd3CP57g3GtOxdrbFvTo99EDaICDkzQKqFX_9Avvwl9-k4r4KJKNsoEwQ6qg48xoNVDcJ0JPxqI3lrVW6t6a1Xvraad6_1hE2vT2pCUufi3SBmtuFIqcZc7ziHi35gLrqQqy19Lnn2q</recordid><startdate>20110601</startdate><enddate>20110601</enddate><creator>Romans, E J</creator><creator>Rozhko, S</creator><creator>Young, L</creator><creator>Blois, A</creator><creator>Ling Hao</creator><creator>Cox, D</creator><creator>Gallop, J C</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Electrical power engineering</topic><topic>Electromagnets</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Inductance</topic><topic>Magnetic field sensitivity</topic><topic>Magnetic fields</topic><topic>Magnetic tunneling</topic><topic>Microelectronic fabrication (materials and surfaces technology)</topic><topic>Nanocomposites</topic><topic>Nanomaterials</topic><topic>nanoscale SQUID</topic><topic>Nanostructure</topic><topic>Niobium</topic><topic>Noise</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>SQUIDs</topic><topic>Superconducting devices</topic><topic>Superconducting magnets</topic><topic>superconducting quantum interference device</topic><topic>Superconductivity</topic><topic>Temperature measurement</topic><topic>Various equipment and components</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Romans, E J</creatorcontrib><creatorcontrib>Rozhko, S</creatorcontrib><creatorcontrib>Young, L</creatorcontrib><creatorcontrib>Blois, A</creatorcontrib><creatorcontrib>Ling Hao</creatorcontrib><creatorcontrib>Cox, D</creatorcontrib><creatorcontrib>Gallop, J C</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on applied superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Romans, E J</au><au>Rozhko, S</au><au>Young, L</au><au>Blois, A</au><au>Ling Hao</au><au>Cox, D</au><au>Gallop, J C</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Noise Performance of Niobium Nano-SQUIDs in Applied Magnetic Fields</atitle><jtitle>IEEE transactions on applied superconductivity</jtitle><stitle>TASC</stitle><date>2011-06-01</date><risdate>2011</risdate><volume>21</volume><issue>3</issue><spage>404</spage><epage>407</epage><pages>404-407</pages><issn>1051-8223</issn><eissn>1558-2515</eissn><coden>ITASE9</coden><abstract>We have fabricated two different designs of niobium dc nano-SQUIDs using focussed ion beam (FIB) lithography with loops and track widths down to 70 nm. We report on the voltage-flux and noise performance of the devices in zero field and with magnetic fields of up to 1 T applied either in-plane or perpendicular to the plane at temperatures between 5 K and 9 K. We compare the measurements with modeled estimates of the inductance of the structures and the conventional theory of noise in dc SQUIDs.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TASC.2010.2090851</doi><tpages>4</tpages></addata></record> |
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| subjects | Applied sciences Direct current Electrical engineering. Electrical power engineering Electromagnets Electronics Exact sciences and technology Inductance Magnetic field sensitivity Magnetic fields Magnetic tunneling Microelectronic fabrication (materials and surfaces technology) Nanocomposites Nanomaterials nanoscale SQUID Nanostructure Niobium Noise Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices SQUIDs Superconducting devices Superconducting magnets superconducting quantum interference device Superconductivity Temperature measurement Various equipment and components |
| title | Noise Performance of Niobium Nano-SQUIDs in Applied Magnetic Fields |
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