Noise Performance of Niobium Nano-SQUIDs in Applied Magnetic Fields

We have fabricated two different designs of niobium dc nano-SQUIDs using focussed ion beam (FIB) lithography with loops and track widths down to 70 nm. We report on the voltage-flux and noise performance of the devices in zero field and with magnetic fields of up to 1 T applied either in-plane or pe...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	IEEE transactions on applied superconductivity 2011-06, Vol.21 (3), p.404-407
Hauptverfasser:	Romans, E J, Rozhko, S, Young, L, Blois, A, Ling Hao, Cox, D, Gallop, J C
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Direct current Electrical engineering. Electrical power engineering Electromagnets Electronics Exact sciences and technology Inductance Magnetic field sensitivity Magnetic fields Magnetic tunneling Microelectronic fabrication (materials and surfaces technology) Nanocomposites Nanomaterials nanoscale SQUID Nanostructure Niobium Noise Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices SQUIDs Superconducting devices Superconducting magnets superconducting quantum interference device Superconductivity Temperature measurement Various equipment and components
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	We have fabricated two different designs of niobium dc nano-SQUIDs using focussed ion beam (FIB) lithography with loops and track widths down to 70 nm. We report on the voltage-flux and noise performance of the devices in zero field and with magnetic fields of up to 1 T applied either in-plane or perpendicular to the plane at temperatures between 5 K and 9 K. We compare the measurements with modeled estimates of the inductance of the structures and the conventional theory of noise in dc SQUIDs.
ISSN:	1051-8223 1558-2515
DOI:	10.1109/TASC.2010.2090851