Investigation of Low-Frequency Excess Flux Noise in DC SQUIDs at mK Temperatures

The excess low-frequency flux noise in dc superconducting quantum interference devices (SQUIDs) operated at ultra-low temperatures was studied. A large number of single SQUIDs as well as SQUID arrays from 16 wafers fabricated over a period of six years were characterized at 4.2 K and

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Bibliographische Detailangaben
Veröffentlicht in:	IEEE transactions on applied superconductivity 2011-06, Vol.21 (3), p.340-344
Hauptverfasser:	Drung, D, Beyer, J, Storm, J, Peters, M, Schurig, T
Format:	Artikel
Sprache:	eng
Schlagworte:	1/f flux noise Applied sciences Devices Direct current Electrical engineering. Electrical power engineering Electromagnets Electronics Energy resolution Exact sciences and technology Fabrication Flux Insulation Low-frequency noise Microelectronic fabrication (materials and surfaces technology) Niobium Noise Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices SQUID current sensor SQUIDs Superconducting devices Superconducting quantum interference devices Superconductivity Temperature measurement ultra-low temperature Various equipment and components
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Beschreibung
Zusammenfassung:	The excess low-frequency flux noise in dc superconducting quantum interference devices (SQUIDs) operated at ultra-low temperatures was studied. A large number of single SQUIDs as well as SQUID arrays from 16 wafers fabricated over a period of six years were characterized at 4.2 K and
ISSN:	1051-8223 1558-2515
DOI:	10.1109/TASC.2010.2084054