Low-frequency measurement of small delay times with application to microwave transistor measurement

Low-frequency measurement of small delay times with application to microwave transistor measurement

A simple low-frequency technique for the measurement of small delay times using an operational amplifier as an integrator is described. It is shown that the frequency capability of the operational amplifier is relatively unimportant and that it should be possible to use this technique for the measur...

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Veröffentlicht in:Proceedings of the IEEE 1972-01, Vol.60 (7), p.910-911
1. Verfasser: Zakarevicius, R.A.
Format: Artikel
Sprache:eng
Schlagworte:
Circuits
Delay effects
Differential amplifiers
Electrons
Measurement techniques
Microwave measurements
Microwave transistors
Operational amplifiers
Transfer functions
Voltage
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Zusammenfassung:A simple low-frequency technique for the measurement of small delay times using an operational amplifier as an integrator is described. It is shown that the frequency capability of the operational amplifier is relatively unimportant and that it should be possible to use this technique for the measurement of the transit times of transistors well into the microwave range.
ISSN:0018-9219
1558-2256
DOI:10.1109/PROC.1972.8802