The IEEE Technical Committee 10-The Waveform Generation, Measurement, and Analysis Committee: Update 2021

The IEEE Technical Committee 10 (TC-10), the Waveform Generation, Measurement, and Analysis Committee of the IEEE Instrumentation and Measurement Society (IMS), supports the advancement of industries and other entities that research, develop, manufacture, and use technologies and instruments that ge...

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Veröffentlicht in:IEEE instrumentation & measurement magazine 2022-11, Vol.25 (8), p.16-18
Hauptverfasser: De Vito, Luca, Jendzurski, John, Rapuano, Sergio, Boyer, William B., Blair, Jerome, Paulter, Nicholas G.
Format: Magazinearticle
Sprache:eng
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Zusammenfassung:The IEEE Technical Committee 10 (TC-10), the Waveform Generation, Measurement, and Analysis Committee of the IEEE Instrumentation and Measurement Society (IMS), supports the advancement of industries and other entities that research, develop, manufacture, and use technologies and instruments that generate or acquire signals. These signals are ubiquitous and used in many technologies, such as, but not limited to, communication, computing, transportation, medicine, entertainment, manufacturing, and agriculture. The TC-10 work, therefore, impacts everyone. Because the TC-10 is a developer of documentary standards, the TC-10's goal is achieved by fulfilling, as best as possible, the global need for standardized terms, test methods, and computational methods that are used to describe and measure the parameters that describe the performance of signal generators and waveform recorders and analyzers. The TC-10 has developed and maintains the following documentary standards: IEEE Std 181-2011, Standard on Transitions, Pulses, and Related Waveforms [1]; IEEE Std 1057-2017, Standard for Digitizing Waveform Recorders [2]; IEEE Std 1241-2010, Standard for Terminology and Test Methods for Analog-to-Digital Converters [3]; IEEE Std 1658-2011, Standard for Terminology and Test Methods for Digital-to-Analog Converters [4]; IEEE Std 1696-2013, Standard for Terminology and Test Methods for Circuit Probes [5]; and IEEE Std. 2414-2020, Standard for Jitter and Phase Noise [6]. Additional information on these standards and the TC-10 can be found in [7], [8].
ISSN:1094-6969
1941-0123
DOI:10.1109/MIM.2022.9908270