System level modeling of supply noise induced jitter for high speed clock forwarding interfaces
Power supply noise induced jitter is one of the dominant timing error components in high-speed I/O interfaces. Designing a high-performance, reliable PHY (Physical Design) requires accurate prediction of supply noise jitter and its impact on the overall system, not solely the component level. Clock...
Gespeichert in:
Veröffentlicht in: | IEEE electromagnetic compatibility magazine 2016-01, Vol.5 (4), p.117-122 |
---|---|
Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 122 |
---|---|
container_issue | 4 |
container_start_page | 117 |
container_title | IEEE electromagnetic compatibility magazine |
container_volume | 5 |
creator | Shim, Yujeong Oh, Dan |
description | Power supply noise induced jitter is one of the dominant timing error components in high-speed I/O interfaces. Designing a high-performance, reliable PHY (Physical Design) requires accurate prediction of supply noise jitter and its impact on the overall system, not solely the component level. Clock forwarding interfaces help reduce the impact of supply noise jitter at the system level as the most common types of jitter can be tracked. Therefore, high-performance, yet cost effective interface designs require accurate modeling of both jitter and system-level margin loss. This paper covers the key fundamentals of supply noise jitter modeling and jitter tracking. Crucial models and formulae are derived and verified, and important design optimization steps are explained in a holistic view. For example, DDR4 PHY design optimization is considered for demonstration. |
doi_str_mv | 10.1109/MEMC.2016.7866249 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_MEMC_2016_7866249</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>7866249</ieee_id><sourcerecordid>1874548657</sourcerecordid><originalsourceid>FETCH-LOGICAL-c213t-d8b183ab2c91a2fa526ee7b13ead8e9785ed07f4227e78798d847be3d24edcbf3</originalsourceid><addsrcrecordid>eNo9kM1OwzAQhC0EElXpAyAuPnJJiR0ndo6oKj9SKw7A2XLsdeuSxMFOQX17ErV0L7ua_WalHYRuSTonJC0f1sv1Yk5TUsy5KArKygs0oaSgCaWcXp7ngl2jWYy7dChOaMrYBMn3Q-yhwTX8QI0bb6B27QZ7i-O-6-oDbr2LgF1r9hoM3rm-h4CtD3jrNlscOxhUXXv9NYq_KpjR7tqBskpDvEFXVtURZqc-RZ9Py4_FS7J6e35dPK4STUnWJ0ZURGSqorokilqV0wKAVyQDZQSUXORgUm7Z8BBwwUthBOMVZIYyMLqy2RTdH-92wX_vIfaycVFDXasW_D5KIjjLmShyPqDkiOrgYwxgZRdco8JBklSOecoxTznmKU95Dp67o8cBwJn_3_4B-FNzBw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1874548657</pqid></control><display><type>article</type><title>System level modeling of supply noise induced jitter for high speed clock forwarding interfaces</title><source>IEEE Electronic Library (IEL)</source><creator>Shim, Yujeong ; Oh, Dan</creator><creatorcontrib>Shim, Yujeong ; Oh, Dan</creatorcontrib><description>Power supply noise induced jitter is one of the dominant timing error components in high-speed I/O interfaces. Designing a high-performance, reliable PHY (Physical Design) requires accurate prediction of supply noise jitter and its impact on the overall system, not solely the component level. Clock forwarding interfaces help reduce the impact of supply noise jitter at the system level as the most common types of jitter can be tracked. Therefore, high-performance, yet cost effective interface designs require accurate modeling of both jitter and system-level margin loss. This paper covers the key fundamentals of supply noise jitter modeling and jitter tracking. Crucial models and formulae are derived and verified, and important design optimization steps are explained in a holistic view. For example, DDR4 PHY design optimization is considered for demonstration.</description><identifier>ISSN: 2162-2264</identifier><identifier>EISSN: 2162-2272</identifier><identifier>DOI: 10.1109/MEMC.2016.7866249</identifier><identifier>CODEN: IECMCU</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Delays ; Design optimization ; Integrated circuit modeling ; Jitter ; Mathematical model ; Modelling ; Noise ; Noise prediction ; Phase locked loops ; Power supplies ; Sensitivity ; Timing analysis ; Tracking ; Vibration</subject><ispartof>IEEE electromagnetic compatibility magazine, 2016-01, Vol.5 (4), p.117-122</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c213t-d8b183ab2c91a2fa526ee7b13ead8e9785ed07f4227e78798d847be3d24edcbf3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7866249$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>315,781,785,797,27929,27930,54763</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7866249$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Shim, Yujeong</creatorcontrib><creatorcontrib>Oh, Dan</creatorcontrib><title>System level modeling of supply noise induced jitter for high speed clock forwarding interfaces</title><title>IEEE electromagnetic compatibility magazine</title><addtitle>MEMC</addtitle><description>Power supply noise induced jitter is one of the dominant timing error components in high-speed I/O interfaces. Designing a high-performance, reliable PHY (Physical Design) requires accurate prediction of supply noise jitter and its impact on the overall system, not solely the component level. Clock forwarding interfaces help reduce the impact of supply noise jitter at the system level as the most common types of jitter can be tracked. Therefore, high-performance, yet cost effective interface designs require accurate modeling of both jitter and system-level margin loss. This paper covers the key fundamentals of supply noise jitter modeling and jitter tracking. Crucial models and formulae are derived and verified, and important design optimization steps are explained in a holistic view. For example, DDR4 PHY design optimization is considered for demonstration.</description><subject>Delays</subject><subject>Design optimization</subject><subject>Integrated circuit modeling</subject><subject>Jitter</subject><subject>Mathematical model</subject><subject>Modelling</subject><subject>Noise</subject><subject>Noise prediction</subject><subject>Phase locked loops</subject><subject>Power supplies</subject><subject>Sensitivity</subject><subject>Timing analysis</subject><subject>Tracking</subject><subject>Vibration</subject><issn>2162-2264</issn><issn>2162-2272</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM1OwzAQhC0EElXpAyAuPnJJiR0ndo6oKj9SKw7A2XLsdeuSxMFOQX17ErV0L7ua_WalHYRuSTonJC0f1sv1Yk5TUsy5KArKygs0oaSgCaWcXp7ngl2jWYy7dChOaMrYBMn3Q-yhwTX8QI0bb6B27QZ7i-O-6-oDbr2LgF1r9hoM3rm-h4CtD3jrNlscOxhUXXv9NYq_KpjR7tqBskpDvEFXVtURZqc-RZ9Py4_FS7J6e35dPK4STUnWJ0ZURGSqorokilqV0wKAVyQDZQSUXORgUm7Z8BBwwUthBOMVZIYyMLqy2RTdH-92wX_vIfaycVFDXasW_D5KIjjLmShyPqDkiOrgYwxgZRdco8JBklSOecoxTznmKU95Dp67o8cBwJn_3_4B-FNzBw</recordid><startdate>20160101</startdate><enddate>20160101</enddate><creator>Shim, Yujeong</creator><creator>Oh, Dan</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20160101</creationdate><title>System level modeling of supply noise induced jitter for high speed clock forwarding interfaces</title><author>Shim, Yujeong ; Oh, Dan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c213t-d8b183ab2c91a2fa526ee7b13ead8e9785ed07f4227e78798d847be3d24edcbf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Delays</topic><topic>Design optimization</topic><topic>Integrated circuit modeling</topic><topic>Jitter</topic><topic>Mathematical model</topic><topic>Modelling</topic><topic>Noise</topic><topic>Noise prediction</topic><topic>Phase locked loops</topic><topic>Power supplies</topic><topic>Sensitivity</topic><topic>Timing analysis</topic><topic>Tracking</topic><topic>Vibration</topic><toplevel>online_resources</toplevel><creatorcontrib>Shim, Yujeong</creatorcontrib><creatorcontrib>Oh, Dan</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE electromagnetic compatibility magazine</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Shim, Yujeong</au><au>Oh, Dan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>System level modeling of supply noise induced jitter for high speed clock forwarding interfaces</atitle><jtitle>IEEE electromagnetic compatibility magazine</jtitle><stitle>MEMC</stitle><date>2016-01-01</date><risdate>2016</risdate><volume>5</volume><issue>4</issue><spage>117</spage><epage>122</epage><pages>117-122</pages><issn>2162-2264</issn><eissn>2162-2272</eissn><coden>IECMCU</coden><abstract>Power supply noise induced jitter is one of the dominant timing error components in high-speed I/O interfaces. Designing a high-performance, reliable PHY (Physical Design) requires accurate prediction of supply noise jitter and its impact on the overall system, not solely the component level. Clock forwarding interfaces help reduce the impact of supply noise jitter at the system level as the most common types of jitter can be tracked. Therefore, high-performance, yet cost effective interface designs require accurate modeling of both jitter and system-level margin loss. This paper covers the key fundamentals of supply noise jitter modeling and jitter tracking. Crucial models and formulae are derived and verified, and important design optimization steps are explained in a holistic view. For example, DDR4 PHY design optimization is considered for demonstration.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/MEMC.2016.7866249</doi><tpages>6</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 2162-2264 |
ispartof | IEEE electromagnetic compatibility magazine, 2016-01, Vol.5 (4), p.117-122 |
issn | 2162-2264 2162-2272 |
language | eng |
recordid | cdi_crossref_primary_10_1109_MEMC_2016_7866249 |
source | IEEE Electronic Library (IEL) |
subjects | Delays Design optimization Integrated circuit modeling Jitter Mathematical model Modelling Noise Noise prediction Phase locked loops Power supplies Sensitivity Timing analysis Tracking Vibration |
title | System level modeling of supply noise induced jitter for high speed clock forwarding interfaces |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-12T04%3A52%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=System%20level%20modeling%20of%20supply%20noise%20induced%20jitter%20for%20high%20speed%20clock%20forwarding%20interfaces&rft.jtitle=IEEE%20electromagnetic%20compatibility%20magazine&rft.au=Shim,%20Yujeong&rft.date=2016-01-01&rft.volume=5&rft.issue=4&rft.spage=117&rft.epage=122&rft.pages=117-122&rft.issn=2162-2264&rft.eissn=2162-2272&rft.coden=IECMCU&rft_id=info:doi/10.1109/MEMC.2016.7866249&rft_dat=%3Cproquest_RIE%3E1874548657%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1874548657&rft_id=info:pmid/&rft_ieee_id=7866249&rfr_iscdi=true |