Polymeric HVDC Cable Design and Space Charge Accumulation. Part 1: Insulation/Semicon Interface
From theory and experiments, it can be deduced that materials for DC applications should not accumulate a large amount of space charge if accelerated degradation of the insulation system is to be avoided. Therefore, the characterization of DC insulation must take into account the evaluation of space...
Gespeichert in:
Veröffentlicht in: | IEEE electrical insulation magazine 2007-11, Vol.23 (6), p.11-19 |
---|---|
Hauptverfasser: | , , , , , , , , |
Format: | Magazinearticle |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | From theory and experiments, it can be deduced that materials for DC applications should not accumulate a large amount of space charge if accelerated degradation of the insulation system is to be avoided. Therefore, the characterization of DC insulation must take into account the evaluation of space charge accumulation. This cannot be done exhaustively without taking a system approach considering both the semiconductive material and the insulation, in particular, the properties of the semicon/insulation interface. The latter interface, in fact, plays a major role in space charge injection/accumulation in the insulation bulk. Having analyzed different semiconductive and insulating materials candidate for HVDC cable applications, the best solution to be exploited for HVDC cable design would be the combination showing a high threshold for space charge accumulation, a small rate of charge accumulation as a function of electric field and a small activation energy, i.e., a space charge amount less dependent on temperature. Therefore, space charge measurements will provide important information to cable material manufacturers with the aim of tailoring insulation and semicon specifically for HVDC application and, thus, improving the reliability of polymeric cables. |
---|---|
ISSN: | 0883-7554 1558-4402 |
DOI: | 10.1109/MEI.2007.4389975 |