A Production IR-Drop Screen on a Chip

Many modern designs have large, localized failures due to excessive power consumption, which can be measured as IR drop. The methodology described here employs an on-chip process-monitoring circuit that is easy to integrate on chip and use in a characterization or production environment, to help ide...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	IEEE design & test of computers 2007-05, Vol.24 (3), p.216-224
Hauptverfasser:	Abuhamdeh, Z., Hannagan, B., Crouch, A.L., Remmers, J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chips Circuits Electric potential Energy consumption Failure Hot spots IR drop Logic testing Methodology Power consumption Power distribution Power grids Power measurement power rails Power supplies power-related failures Production production screen Rails screen on a chip Screens Semiconductor device measurement Voltage
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Many modern designs have large, localized failures due to excessive power consumption, which can be measured as IR drop. The methodology described here employs an on-chip process-monitoring circuit that is easy to integrate on chip and use in a characterization or production environment, to help identify and localize IR-drop hot spots and power-related failures.
ISSN:	0740-7475 2168-2356 1558-1918 2168-2364
DOI:	10.1109/MDT.2007.59