Scan Design Using Standard Flip-Flops

Scan Design Using Standard Flip-Flops

Classical scan designs require properly augmented flip-flops, often called scan flip-flops. Problems stem from the high area overhead implied by the need for these flip-flops or the inability to modify standard flip-flops. The authors outline a method to design easily testable sequential circuits th...

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Veröffentlicht in:IEEE design & test of computers 1987-02, Vol.4 (1), p.52-54
Hauptverfasser: Reddy, Sudhakar M., Dandapani, R.
Format: Artikel
Sprache:eng
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Zusammenfassung:Classical scan designs require properly augmented flip-flops, often called scan flip-flops. Problems stem from the high area overhead implied by the need for these flip-flops or the inability to modify standard flip-flops. The authors outline a method to design easily testable sequential circuits that achieve scan designs using standard (unmodified) flip-flops.
ISSN:0740-7475
1558-1918
DOI:10.1109/MDT.1987.295115