SiGe Quantum Dots Over Si Pillars for Visible to Near-Infrared Broadband Photodetection

We demonstrate a successful selective growth of Si 0.3 Ge 0.7 quantum dots (QDs) over array of p + -Si nanopillars using a low-pressure chemical vapor deposition technique, and hereafter realized high-performance QD broadband photodiodes for visible to near-infrared photodetection based on heterostr...

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Veröffentlicht in:IEEE photonics technology letters 2013-08, Vol.25 (15), p.1520-1523
Hauptverfasser: Lai, Wei-Ting, Liao, Po-Hsiang, Homyk, Andrew P., Scherer, Axel, Li, Pei-Wen
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Sprache:eng
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Zusammenfassung:We demonstrate a successful selective growth of Si 0.3 Ge 0.7 quantum dots (QDs) over array of p + -Si nanopillars using a low-pressure chemical vapor deposition technique, and hereafter realized high-performance QD broadband photodiodes for visible to near-infrared photodetection based on heterostructures of indium tin oxide/Si 0.3 Ge 0.7 QD/Si pillar. Thanks to effective hole confinement and thus a built-in electric field within the SiGe QD, high ratios of photocurrent to dark current of ~2200, 100, and 30, respectively, were measured on our SiGe QDs-based photodiodes under illumination of 9 mW/cm 2 at wavelength of 500-800, 1300, and 1500 nm. The QD photodiode exhibits a very low dark current density of 3.2 × 10 -8 A/cm 2 and a tunable power-dependent linearity by applied voltage through the competition of electron drift and carrier recombination processes.
ISSN:1041-1135
1941-0174
DOI:10.1109/LPT.2013.2270281