Reducing the Number of Measurements of a Multiport Circuit Using Covering Designs and Turán Systems

A theory of arrangements of measurements for obtaining the scattering matrix of a v -port circuit using a k -port vector network analyzer (VNA) is developed based on covering designs and Turán systems, which are two kinds of structures in combinatorial design theory. The results of this letter pro...

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Veröffentlicht in:	IEEE microwave and wireless technology letters (Print) 2023-02, Vol.33 (2), p.1-3
Hauptverfasser:	Chien, Yung-Chi, Liu, Hsu-Wei, Wu, Tzong-Lin
Format:	Artikel
Sprache:	eng
Schlagworte:	Covering design covering number design of experiments (DOE) Impedance Impedance measurement Microwave circuits Microwave measurement multiport measurement Scattering scattering matrix scattering parameter Scattering parameters Turán number Turán system vector network analyzer (VNA) Wireless communication
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