Reducing the Number of Measurements of a Multiport Circuit Using Covering Designs and Turán Systems

Reducing the Number of Measurements of a Multiport Circuit Using Covering Designs and Turán Systems

A theory of arrangements of measurements for obtaining the scattering matrix of a v -port circuit using a k -port vector network analyzer (VNA) is developed based on covering designs and Turán systems, which are two kinds of structures in combinatorial design theory. The results of this letter pro...

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Veröffentlicht in:IEEE microwave and wireless technology letters (Print) 2023-02, Vol.33 (2), p.1-3
Hauptverfasser: Chien, Yung-Chi, Liu, Hsu-Wei, Wu, Tzong-Lin
Format: Artikel
Sprache:eng
Schlagworte:
Covering design
covering number
design of experiments (DOE)
Impedance
Impedance measurement
Microwave circuits
Microwave measurement
multiport measurement
Scattering
scattering matrix
scattering parameter
Scattering parameters
Turán number
Turán system
vector network analyzer (VNA)
Wireless communication
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Zusammenfassung:A theory of arrangements of measurements for obtaining the scattering matrix of a v -port circuit using a k -port vector network analyzer (VNA) is developed based on covering designs and Turán systems, which are two kinds of structures in combinatorial design theory. The results of this letter provide a general strategy for reducing the number of multiport measurements of microwave circuits.
ISSN:2771-957X
2771-9588
DOI:10.1109/LMWC.2022.3215290