Reducing the Number of Measurements of a Multiport Circuit Using Covering Designs and Turán Systems
A theory of arrangements of measurements for obtaining the scattering matrix of a v -port circuit using a k -port vector network analyzer (VNA) is developed based on covering designs and Turán systems, which are two kinds of structures in combinatorial design theory. The results of this letter pro...
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| Veröffentlicht in: | IEEE microwave and wireless technology letters (Print) 2023-02, Vol.33 (2), p.1-3 |
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| container_title | IEEE microwave and wireless technology letters (Print) |
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| creator | Chien, Yung-Chi Liu, Hsu-Wei Wu, Tzong-Lin |
| description | A theory of arrangements of measurements for obtaining the scattering matrix of a v -port circuit using a k -port vector network analyzer (VNA) is developed based on covering designs and Turán systems, which are two kinds of structures in combinatorial design theory. The results of this letter provide a general strategy for reducing the number of multiport measurements of microwave circuits. |
| doi_str_mv | 10.1109/LMWC.2022.3215290 |
| format | Article |
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The results of this letter provide a general strategy for reducing the number of multiport measurements of microwave circuits.]]></description><identifier>ISSN: 2771-957X</identifier><identifier>EISSN: 2771-9588</identifier><identifier>DOI: 10.1109/LMWC.2022.3215290</identifier><identifier>CODEN: IMWTAZ</identifier><language>eng</language><publisher>IEEE</publisher><subject>Covering design ; covering number ; design of experiments (DOE) ; Impedance ; Impedance measurement ; Microwave circuits ; Microwave measurement ; multiport measurement ; Scattering ; scattering matrix ; scattering parameter ; Scattering parameters ; Turán number ; Turán system ; vector network analyzer (VNA) ; Wireless communication</subject><ispartof>IEEE microwave and wireless technology letters (Print), 2023-02, Vol.33 (2), p.1-3</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c265t-cf05bd6afeb5ab63407e780abab2ce98c5c27a1b60bffdf292d91e62090b88dc3</citedby><cites>FETCH-LOGICAL-c265t-cf05bd6afeb5ab63407e780abab2ce98c5c27a1b60bffdf292d91e62090b88dc3</cites><orcidid>0000-0002-5751-5297 ; 0000-0002-1804-6344 ; 0000-0002-3560-8898</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9933357$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>315,781,785,797,27928,27929,54762</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9933357$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Chien, Yung-Chi</creatorcontrib><creatorcontrib>Liu, Hsu-Wei</creatorcontrib><creatorcontrib>Wu, Tzong-Lin</creatorcontrib><title>Reducing the Number of Measurements of a Multiport Circuit Using Covering Designs and Turán Systems</title><title>IEEE microwave and wireless technology letters (Print)</title><addtitle>LMWT</addtitle><description><![CDATA[A theory of arrangements of measurements for obtaining the scattering matrix of a <inline-formula> <tex-math notation="LaTeX">v</tex-math> </inline-formula>-port circuit using a <inline-formula> <tex-math notation="LaTeX">k</tex-math> </inline-formula>-port vector network analyzer (VNA) is developed based on covering designs and Turán systems, which are two kinds of structures in combinatorial design theory. The results of this letter provide a general strategy for reducing the number of multiport measurements of microwave circuits.]]></description><subject>Covering design</subject><subject>covering number</subject><subject>design of experiments (DOE)</subject><subject>Impedance</subject><subject>Impedance measurement</subject><subject>Microwave circuits</subject><subject>Microwave measurement</subject><subject>multiport measurement</subject><subject>Scattering</subject><subject>scattering matrix</subject><subject>scattering parameter</subject><subject>Scattering parameters</subject><subject>Turán number</subject><subject>Turán system</subject><subject>vector network analyzer (VNA)</subject><subject>Wireless communication</subject><issn>2771-957X</issn><issn>2771-9588</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kF1Kw0AUhQdRsNQuQHyZDaTemThJ5lHiT4VWQVv0LczPnRppkjIzEboc1-LGNLT06Z4L5zsPHyGXDKaMgbyeL97LKQfOpylngks4ISOe5yyRoihOjzn_OCeTEL4AgMuMZ0yMiH1F25u6XdP4ifS5bzR62jm6QBV6jw22MQy_oot-E-tt5yMta2_6OtJVGLiy-0Y_hDsM9boNVLWWLnv_-9PSt12I2IQLcubUJuDkcMdk9XC_LGfJ_OXxqbydJ4ZnIibGgdA2Uw61UDpLbyDHvAClleYGZWGE4bliOgPtnHVccisZZhwk6KKwJh0Ttt81vgvBo6u2vm6U31UMqsFUNZiqBlPVwdQ_c7VnakQ89qVM01Tk6R8F6meU</recordid><startdate>20230201</startdate><enddate>20230201</enddate><creator>Chien, Yung-Chi</creator><creator>Liu, Hsu-Wei</creator><creator>Wu, Tzong-Lin</creator><general>IEEE</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0002-5751-5297</orcidid><orcidid>https://orcid.org/0000-0002-1804-6344</orcidid><orcidid>https://orcid.org/0000-0002-3560-8898</orcidid></search><sort><creationdate>20230201</creationdate><title>Reducing the Number of Measurements of a Multiport Circuit Using Covering Designs and Turán Systems</title><author>Chien, Yung-Chi ; Liu, Hsu-Wei ; Wu, Tzong-Lin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c265t-cf05bd6afeb5ab63407e780abab2ce98c5c27a1b60bffdf292d91e62090b88dc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Covering design</topic><topic>covering number</topic><topic>design of experiments (DOE)</topic><topic>Impedance</topic><topic>Impedance measurement</topic><topic>Microwave circuits</topic><topic>Microwave measurement</topic><topic>multiport measurement</topic><topic>Scattering</topic><topic>scattering matrix</topic><topic>scattering parameter</topic><topic>Scattering parameters</topic><topic>Turán number</topic><topic>Turán system</topic><topic>vector network analyzer (VNA)</topic><topic>Wireless communication</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chien, Yung-Chi</creatorcontrib><creatorcontrib>Liu, Hsu-Wei</creatorcontrib><creatorcontrib>Wu, Tzong-Lin</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><jtitle>IEEE microwave and wireless technology letters (Print)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chien, Yung-Chi</au><au>Liu, Hsu-Wei</au><au>Wu, Tzong-Lin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reducing the Number of Measurements of a Multiport Circuit Using Covering Designs and Turán Systems</atitle><jtitle>IEEE microwave and wireless technology letters (Print)</jtitle><stitle>LMWT</stitle><date>2023-02-01</date><risdate>2023</risdate><volume>33</volume><issue>2</issue><spage>1</spage><epage>3</epage><pages>1-3</pages><issn>2771-957X</issn><eissn>2771-9588</eissn><coden>IMWTAZ</coden><abstract><![CDATA[A theory of arrangements of measurements for obtaining the scattering matrix of a <inline-formula> <tex-math notation="LaTeX">v</tex-math> </inline-formula>-port circuit using a <inline-formula> <tex-math notation="LaTeX">k</tex-math> </inline-formula>-port vector network analyzer (VNA) is developed based on covering designs and Turán systems, which are two kinds of structures in combinatorial design theory. The results of this letter provide a general strategy for reducing the number of multiport measurements of microwave circuits.]]></abstract><pub>IEEE</pub><doi>10.1109/LMWC.2022.3215290</doi><tpages>3</tpages><orcidid>https://orcid.org/0000-0002-5751-5297</orcidid><orcidid>https://orcid.org/0000-0002-1804-6344</orcidid><orcidid>https://orcid.org/0000-0002-3560-8898</orcidid></addata></record> |
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| source | IEEE Electronic Library (IEL) |
| subjects | Covering design covering number design of experiments (DOE) Impedance Impedance measurement Microwave circuits Microwave measurement multiport measurement Scattering scattering matrix scattering parameter Scattering parameters Turán number Turán system vector network analyzer (VNA) Wireless communication |
| title | Reducing the Number of Measurements of a Multiport Circuit Using Covering Designs and Turán Systems |
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