Abrupt Insertion Loss Drop by RF-Triggering of the Phase Transition in CPW Switches

We demonstrate an abrupt drop in insertion loss (up to 21 dB) at a critical RF (10 GHz) power in 2-port series co-planar waveguides incorporating vanadium dioxide thin films. We rigorously determine the critical delivered power for switching by calculating the waveguide reflection coefficients from...

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Veröffentlicht in:IEEE microwave and wireless components letters 2014-08, Vol.24 (8), p.575-577
Hauptverfasser: Ha, Sieu D., You Zhou, Fisher, Christopher J., Ramanathan, Shriram, Treadway, Jacob P.
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Sprache:eng
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Zusammenfassung:We demonstrate an abrupt drop in insertion loss (up to 21 dB) at a critical RF (10 GHz) power in 2-port series co-planar waveguides incorporating vanadium dioxide thin films. We rigorously determine the critical delivered power for switching by calculating the waveguide reflection coefficients from a lumped element model. Through analysis of the critical RF power, we find definitively that the drop is caused by RF triggering of the vanadium dioxide metal-insulator phase transition in the absence of DC bias. The sharp insertion loss drop may have use in broadband receiver protectors, RF switching, and tunable coupling applications.
ISSN:1531-1309
2771-957X
1558-1764
2771-9588
DOI:10.1109/LMWC.2014.2323703