High-Performance Black Phosphorus MOSFETs Using Crystal Orientation Control and Contact Engineering

We report high performance, orientation-controlled, and locally back-gated black phosphorus (BP) n-MOSFETs and p-MOSFETs with titanium and permalloy contacts, respectively. Devices with channel length ranging from 0.3 to 0.7 μm are analyzed. Armchair-oriented BP p-MOSFETs (n-MOSFETs) display 3.5 tim...

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Veröffentlicht in:IEEE electron device letters 2017-05, Vol.38 (5), p.685-688
Hauptverfasser: Haratipour, Nazila, Namgung, Seon, Grassi, Roberto, Low, Tony, Sang-Hyun Oh, Koester, Steven J.
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Sprache:eng
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Zusammenfassung:We report high performance, orientation-controlled, and locally back-gated black phosphorus (BP) n-MOSFETs and p-MOSFETs with titanium and permalloy contacts, respectively. Devices with channel length ranging from 0.3 to 0.7 μm are analyzed. Armchair-oriented BP p-MOSFETs (n-MOSFETs) display 3.5 times (1.5 times) higher maximum current compared with zigzag devices. Saturated transconductance values up to 4.8 times (1.6 times) higher for BP p-MOSFETs (n-MOSFETs) oriented along the armchair direction compared with the zigzag direction are observed. Using this orientation control and contact engineering, n-MOSFETs with transconductance of 110 μS/μm and p-MOSFETs with contact resistance as low as 0.31 kQ · μm are demonstrated.
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2017.2679117