InZnO/AlSnZnInO Bilayer Oxide Thin-Film Transistors With High Mobility and High Uniformity
In this letter, high-performance InZnO/AlSnZnInO (IZO/ATZIO) bilayer thin-film transistors (TFTs) with an inverted staggered back channel etch structure are presented. The channel width and the length were both 6 μm, which is small enough to be adapted to a high-resolution display backplane. High fi...
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Veröffentlicht in: | IEEE electron device letters 2016-10, Vol.37 (10), p.1295-1298 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | In this letter, high-performance InZnO/AlSnZnInO (IZO/ATZIO) bilayer thin-film transistors (TFTs) with an inverted staggered back channel etch structure are presented. The channel width and the length were both 6 μm, which is small enough to be adapted to a high-resolution display backplane. High field-effect mobility (μ FE ) over 60 cm 2 /Vs was obtained from the structure with 8-nm IZO channel insertion between the gate dielectric and the ATZIO layer. The device shows good controllability in light of TFT operation. The subthreshold slope, turn-ON voltage (V ON ), and ON/OFF ratio were 0.16 V/decade, -1.52 V, and 5×10 9 , respectively. |
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ISSN: | 0741-3106 1558-0563 |
DOI: | 10.1109/LED.2016.2602284 |