A Fast and Efficient Free-Space Dielectric Measurement Technique at mm-Wave Frequencies

A simple setup along with an efficient free-space technique is proposed in this work to characterize dielectric materials at millimeter-wave (mm-wave) frequencies. The technique relies on measured scattering parameters without the need to perform complex free-space calibrations. Two simple adjustments are instead performed in the setup and in the calculations to de-embed both phase and magnitude effects of the free-space from the final results. Different materials having low and high permitivities are tested using this method. Comparisons between the measured results and measured data, available from other techniques, confirm the effectiveness of this approach in fast and simple evaluation of materials at mm-wave frequencies.