Vertical Dependence of Refractive Index Structure Constant in Lowest Troposphere
Vertical profiles of atmospheric refractivity are indirectly measured at heights of up to 150 m above the ground using meteorological sensors located at 19 heights. The structure constant of the refractive index C n is calculated from data measured over a one-year period using its definition relatio...
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Veröffentlicht in: | IEEE antennas and wireless propagation letters 2011, Vol.10, p.1473-1475 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Vertical profiles of atmospheric refractivity are indirectly measured at heights of up to 150 m above the ground using meteorological sensors located at 19 heights. The structure constant of the refractive index C n is calculated from data measured over a one-year period using its definition relation. Linear regression in heights is applied to a structure constant vertical dependence to obtain single and joint annual statistics of the near ground value of C n and of its vertical gradient in the lowest troposphere. Approximate probability models are given with C n being log-normal and the vertical gradient normally distributed. |
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ISSN: | 1536-1225 1548-5757 |
DOI: | 10.1109/LAWP.2011.2178809 |