Vertical Dependence of Refractive Index Structure Constant in Lowest Troposphere

Vertical profiles of atmospheric refractivity are indirectly measured at heights of up to 150 m above the ground using meteorological sensors located at 19 heights. The structure constant of the refractive index C n is calculated from data measured over a one-year period using its definition relatio...

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Veröffentlicht in:IEEE antennas and wireless propagation letters 2011, Vol.10, p.1473-1475
Hauptverfasser: Grabner, M., Kvicera, V., Pechac, P., Jicha, O.
Format: Artikel
Sprache:eng
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Zusammenfassung:Vertical profiles of atmospheric refractivity are indirectly measured at heights of up to 150 m above the ground using meteorological sensors located at 19 heights. The structure constant of the refractive index C n is calculated from data measured over a one-year period using its definition relation. Linear regression in heights is applied to a structure constant vertical dependence to obtain single and joint annual statistics of the near ground value of C n and of its vertical gradient in the lowest troposphere. Approximate probability models are given with C n being log-normal and the vertical gradient normally distributed.
ISSN:1536-1225
1548-5757
DOI:10.1109/LAWP.2011.2178809