Progress on collisionally pumped optical-field-ionization soft X-ray lasers

We present the status of optical field ionization soft X-ray lasers. The amplifying medium is generated by focusing a high-energy circularly polarized 30-fs 10-Hz Ti: sapphire laser system in a gaseous medium. Using xenon or krypton, strong laser emission at 41.8 and 32.8 nm, respectively, has been...

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Veröffentlicht in:	IEEE journal of selected topics in quantum electronics 2004-11, Vol.10 (6), p.1351-1362
Hauptverfasser:	Sebban, S., Mocek, T., Bettaibi, I., Cros, B., Maynard, G., Butler, A., Gonzalves, A.J., McKenna, C.M., Spence, D.J., Hooker, S.M., Upcraft, L.M., Breger, P., Agostini, P., le Pape, S., Zeitoun, P., Valentin, C., Balcou, P., Ros, D., Kazamias, S., Klisnick, A., Jamelot, G., Rus, B., Wyart, J.F.
Format:	Artikel
Sprache:	eng
Schlagworte:	Gas lasers High-intensity laser Ionization Laser excitation laser plasma Laser theory optical field ionization (OFI) Optical polarization Optical pumping Optics Physics Pump lasers Stimulated emission X-ray laser (XRL) X-ray lasers Xenon
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Beschreibung
Zusammenfassung:	We present the status of optical field ionization soft X-ray lasers. The amplifying medium is generated by focusing a high-energy circularly polarized 30-fs 10-Hz Ti: sapphire laser system in a gaseous medium. Using xenon or krypton, strong laser emission at 41.8 and 32.8 nm, respectively, has been observed. After presenting the basis of the physics, we present recent characterization of the sources as well as dramatic improvement of their performances using the waveguiding technique.
ISSN:	1077-260X 1558-4542
DOI:	10.1109/JSTQE.2004.838039