Synchronous Ultra-High-Density 2RW Dual-Port 8T-SRAM With Circumvention of Simultaneous Common-Row-Access

We propose an access scheme for a synchronous dual- port (DP) SRAM that minimizes the 8T-DP-cell area and maintains cell stability. A priority row decoder circuit and shifted bit- line access scheme eliminates access conflict issues. Using 65 nm CMOS technology (hp90) with the proposed scheme, we fa...

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Veröffentlicht in:IEEE journal of solid-state circuits 2009-03, Vol.44 (3), p.977-986
Hauptverfasser: Nii, K., Tsukamoto, Y., Yabuuchi, M., Masuda, Y., Imaoka, S., Usui, K., Ohbayashi, S., Makino, H., Shinohara, H.
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Sprache:eng
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Zusammenfassung:We propose an access scheme for a synchronous dual- port (DP) SRAM that minimizes the 8T-DP-cell area and maintains cell stability. A priority row decoder circuit and shifted bit- line access scheme eliminates access conflict issues. Using 65 nm CMOS technology (hp90) with the proposed scheme, we fabricated 32 kB DP-SRAM macros. We obtained a 0.71 mum 2 8T-DP-cell for which the cell size is only 1.44 times larger than a 6T-single-port (SP)- cell. The bit-density of the fabricated 32 kB DP-RAM macro is 667 kbit/mm 2 , which is 25% larger than a conventional 8T SRAM. The standby leakage is 27% less because of the small drive-NMOS transistor of the proposed 8T-DP-cell.
ISSN:0018-9200
1558-173X
DOI:10.1109/JSSC.2009.2013766