Computer-aided design in VLSI device development

Computer-aided design (CAD) has been used extensively in the development of VLSI MOS technology at Hewlett-Packard Laboratory. The CAD system for MOS device design is described. The development of the p-channel transistor with submicrometer channel length, trench isolation in CMOS, and side-wall-mas...

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Veröffentlicht in:IEEE journal of solid-state circuits 1985-04, Vol.20 (2), p.495-500
Hauptverfasser: Cham, K.M., Oh, S.-Y., Moll, J.L.
Format: Artikel
Sprache:eng
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Zusammenfassung:Computer-aided design (CAD) has been used extensively in the development of VLSI MOS technology at Hewlett-Packard Laboratory. The CAD system for MOS device design is described. The development of the p-channel transistor with submicrometer channel length, trench isolation in CMOS, and side-wall-masked isolation (SWAMI) for VLSI technology are then presented, followed by a discussion of the techniques used in the simulation of parasitic capacitances in multilayer interconnects for circuit performance evaluations.
ISSN:0018-9200
1558-173X
DOI:10.1109/JSSC.1985.1052335