Full-speed testing of A/D converters
Improved computer-aided analog-to-digital converter (ADC) characterization methods based on the code density test and spectral analysis using the fast Fourier transform are described. The code density test produces a histogram of the digital output codes of an ADC sampling a known input. The code de...
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| Veröffentlicht in: | IEEE journal of solid-state circuits 1984-12, Vol.19 (6), p.820-827 |
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| container_end_page | 827 |
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| container_title | IEEE journal of solid-state circuits |
| container_volume | 19 |
| creator | Doernberg, J. Lee, H.-S. Hodges, D.A. |
| description | Improved computer-aided analog-to-digital converter (ADC) characterization methods based on the code density test and spectral analysis using the fast Fourier transform are described. The code density test produces a histogram of the digital output codes of an ADC sampling a known input. The code density can be interpreted to compute the differential and integral nonlinearities, gain error, offset error, and internal noise. Conversion-rate and frequency-dependent behavior can also be measured. |
| doi_str_mv | 10.1109/JSSC.1984.1052232 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_JSSC_1984_1052232</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1052232</ieee_id><sourcerecordid>28269155</sourcerecordid><originalsourceid>FETCH-LOGICAL-c323t-d5cfe7144baea85076d9990a8e73f713c79a769908232fa96118c20f884d57543</originalsourceid><addsrcrecordid>eNpNkE9LAzEQxYMoWKsfQLzsoXjbNpNsNsmx1NY_FDxUwVuI2YmsbHdrshX89qZsEU_DDO_9ePMIuQY6BaB69rTZLKagVTEFKhjj7ISMQAiVg-Rvp2REKahcM0rPyUWMn2ktCgUjMlntmyaPO8Qq6zH2dfuRdT6bz-4y17XfGHoM8ZKcedtEvDrOMXldLV8WD_n6-f5xMV_njjPe55VwHmUCv1u0SlBZVlprahVK7iVwJ7WVZbqolM9bXQIox6hXqqiEFAUfk9uBuwvd1z6lMds6Omwa22K3j4YpVur0VRLCIHShizGgN7tQb234MUDNoQ9z6MMc-jDHPpJncoTb6Gzjg21dHf-MiQtSQ5LdDLIaEf9hB8gvOwll7g</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28269155</pqid></control><display><type>article</type><title>Full-speed testing of A/D converters</title><source>IEEE Electronic Library (IEL)</source><creator>Doernberg, J. ; Lee, H.-S. ; Hodges, D.A.</creator><creatorcontrib>Doernberg, J. ; Lee, H.-S. ; Hodges, D.A.</creatorcontrib><description>Improved computer-aided analog-to-digital converter (ADC) characterization methods based on the code density test and spectral analysis using the fast Fourier transform are described. The code density test produces a histogram of the digital output codes of an ADC sampling a known input. The code density can be interpreted to compute the differential and integral nonlinearities, gain error, offset error, and internal noise. Conversion-rate and frequency-dependent behavior can also be measured.</description><identifier>ISSN: 0018-9200</identifier><identifier>EISSN: 1558-173X</identifier><identifier>DOI: 10.1109/JSSC.1984.1052232</identifier><identifier>CODEN: IJSCBC</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Analog-digital conversion ; Applied sciences ; Circuit properties ; Circuit testing ; Computer errors ; Electric, optical and optoelectronic circuits ; Electronic circuits ; Electronics ; Exact sciences and technology ; Fast Fourier transforms ; Frequency conversion ; Histograms ; Laboratories ; Linearity ; Sampling methods ; Semiconductor device noise ; Signal convertors</subject><ispartof>IEEE journal of solid-state circuits, 1984-12, Vol.19 (6), p.820-827</ispartof><rights>1985 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c323t-d5cfe7144baea85076d9990a8e73f713c79a769908232fa96118c20f884d57543</citedby><cites>FETCH-LOGICAL-c323t-d5cfe7144baea85076d9990a8e73f713c79a769908232fa96118c20f884d57543</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1052232$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1052232$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=9151791$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Doernberg, J.</creatorcontrib><creatorcontrib>Lee, H.-S.</creatorcontrib><creatorcontrib>Hodges, D.A.</creatorcontrib><title>Full-speed testing of A/D converters</title><title>IEEE journal of solid-state circuits</title><addtitle>JSSC</addtitle><description>Improved computer-aided analog-to-digital converter (ADC) characterization methods based on the code density test and spectral analysis using the fast Fourier transform are described. The code density test produces a histogram of the digital output codes of an ADC sampling a known input. The code density can be interpreted to compute the differential and integral nonlinearities, gain error, offset error, and internal noise. Conversion-rate and frequency-dependent behavior can also be measured.</description><subject>Analog-digital conversion</subject><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Circuit testing</subject><subject>Computer errors</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fast Fourier transforms</subject><subject>Frequency conversion</subject><subject>Histograms</subject><subject>Laboratories</subject><subject>Linearity</subject><subject>Sampling methods</subject><subject>Semiconductor device noise</subject><subject>Signal convertors</subject><issn>0018-9200</issn><issn>1558-173X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1984</creationdate><recordtype>article</recordtype><recordid>eNpNkE9LAzEQxYMoWKsfQLzsoXjbNpNsNsmx1NY_FDxUwVuI2YmsbHdrshX89qZsEU_DDO_9ePMIuQY6BaB69rTZLKagVTEFKhjj7ISMQAiVg-Rvp2REKahcM0rPyUWMn2ktCgUjMlntmyaPO8Qq6zH2dfuRdT6bz-4y17XfGHoM8ZKcedtEvDrOMXldLV8WD_n6-f5xMV_njjPe55VwHmUCv1u0SlBZVlprahVK7iVwJ7WVZbqolM9bXQIox6hXqqiEFAUfk9uBuwvd1z6lMds6Omwa22K3j4YpVur0VRLCIHShizGgN7tQb234MUDNoQ9z6MMc-jDHPpJncoTb6Gzjg21dHf-MiQtSQ5LdDLIaEf9hB8gvOwll7g</recordid><startdate>19841201</startdate><enddate>19841201</enddate><creator>Doernberg, J.</creator><creator>Lee, H.-S.</creator><creator>Hodges, D.A.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19841201</creationdate><title>Full-speed testing of A/D converters</title><author>Doernberg, J. ; Lee, H.-S. ; Hodges, D.A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c323t-d5cfe7144baea85076d9990a8e73f713c79a769908232fa96118c20f884d57543</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1984</creationdate><topic>Analog-digital conversion</topic><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Circuit testing</topic><topic>Computer errors</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fast Fourier transforms</topic><topic>Frequency conversion</topic><topic>Histograms</topic><topic>Laboratories</topic><topic>Linearity</topic><topic>Sampling methods</topic><topic>Semiconductor device noise</topic><topic>Signal convertors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Doernberg, J.</creatorcontrib><creatorcontrib>Lee, H.-S.</creatorcontrib><creatorcontrib>Hodges, D.A.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE journal of solid-state circuits</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Doernberg, J.</au><au>Lee, H.-S.</au><au>Hodges, D.A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Full-speed testing of A/D converters</atitle><jtitle>IEEE journal of solid-state circuits</jtitle><stitle>JSSC</stitle><date>1984-12-01</date><risdate>1984</risdate><volume>19</volume><issue>6</issue><spage>820</spage><epage>827</epage><pages>820-827</pages><issn>0018-9200</issn><eissn>1558-173X</eissn><coden>IJSCBC</coden><abstract>Improved computer-aided analog-to-digital converter (ADC) characterization methods based on the code density test and spectral analysis using the fast Fourier transform are described. The code density test produces a histogram of the digital output codes of an ADC sampling a known input. The code density can be interpreted to compute the differential and integral nonlinearities, gain error, offset error, and internal noise. Conversion-rate and frequency-dependent behavior can also be measured.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/JSSC.1984.1052232</doi><tpages>8</tpages></addata></record> |
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| identifier | ISSN: 0018-9200 |
| ispartof | IEEE journal of solid-state circuits, 1984-12, Vol.19 (6), p.820-827 |
| issn | 0018-9200 1558-173X |
| language | eng |
| recordid | cdi_crossref_primary_10_1109_JSSC_1984_1052232 |
| source | IEEE Electronic Library (IEL) |
| subjects | Analog-digital conversion Applied sciences Circuit properties Circuit testing Computer errors Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Fast Fourier transforms Frequency conversion Histograms Laboratories Linearity Sampling methods Semiconductor device noise Signal convertors |
| title | Full-speed testing of A/D converters |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T10%3A08%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Full-speed%20testing%20of%20A/D%20converters&rft.jtitle=IEEE%20journal%20of%20solid-state%20circuits&rft.au=Doernberg,%20J.&rft.date=1984-12-01&rft.volume=19&rft.issue=6&rft.spage=820&rft.epage=827&rft.pages=820-827&rft.issn=0018-9200&rft.eissn=1558-173X&rft.coden=IJSCBC&rft_id=info:doi/10.1109/JSSC.1984.1052232&rft_dat=%3Cproquest_RIE%3E28269155%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=28269155&rft_id=info:pmid/&rft_ieee_id=1052232&rfr_iscdi=true |