Full-speed testing of A/D converters

Full-speed testing of A/D converters

Improved computer-aided analog-to-digital converter (ADC) characterization methods based on the code density test and spectral analysis using the fast Fourier transform are described. The code density test produces a histogram of the digital output codes of an ADC sampling a known input. The code de...

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Veröffentlicht in:IEEE journal of solid-state circuits 1984-12, Vol.19 (6), p.820-827
Hauptverfasser: Doernberg, J., Lee, H.-S., Hodges, D.A.
Format: Artikel
Sprache:eng
Schlagworte:
Analog-digital conversion
Applied sciences
Circuit properties
Circuit testing
Computer errors
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
Fast Fourier transforms
Frequency conversion
Histograms
Laboratories
Linearity
Sampling methods
Semiconductor device noise
Signal convertors
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Beschreibung
Zusammenfassung:Improved computer-aided analog-to-digital converter (ADC) characterization methods based on the code density test and spectral analysis using the fast Fourier transform are described. The code density test produces a histogram of the digital output codes of an ADC sampling a known input. The code density can be interpreted to compute the differential and integral nonlinearities, gain error, offset error, and internal noise. Conversion-rate and frequency-dependent behavior can also be measured.
ISSN:0018-9200
1558-173X
DOI:10.1109/JSSC.1984.1052232