A Mixed-Voltage Sensor Readout Circuit With On-Chip Calibration and Built-In Self-Test

This paper reports a mixed-voltage mixed-signal chip for interfacing multiple capacitive transducers to embedded processors in integrated microsystems. A programmable switched-capacitor readout circuit accommodates capacitive sensors from 16 fF to 40 pF and allows self-test and online calibration. T...

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Veröffentlicht in:IEEE sensors journal 2007-09, Vol.7 (9), p.1225-1232
Hauptverfasser: Mason, A., Chavan, A.V., Wise, K.D.
Format: Artikel
Sprache:eng
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Zusammenfassung:This paper reports a mixed-voltage mixed-signal chip for interfacing multiple capacitive transducers to embedded processors in integrated microsystems. A programmable switched-capacitor readout circuit accommodates capacitive sensors from 16 fF to 40 pF and allows self-test and online calibration. The 20 mm 2 chip has a sensitivity of 1.25 mV/fF and is realized in a 1 mum n-well BiCMOS 2 P/2 M process that permits high-voltage operation, large-value resistors, and nonvolatile on-chip memory. An on-chip charge pump generates voltages up to 30 V that permits transducer electrostatic self-test. In normal operation mode, the chip provides a fast sensor readout consuming only 90 nj of energy, making it suitable for portable applications.
ISSN:1530-437X
1558-1748
DOI:10.1109/JSEN.2007.897957