A Double-Crystal X-Ray Goniometer for Accurate Orientation Determination

A Double-Crystal X-Ray Goniometer for Accurate Orientation Determination

An X-ray goniometer is turned into a double-crystal goniometer for use on precision cut AT quartz plates. Errors due to temperature change and to X-ray refraction are discussed. Precision of about one-tenth of a minute of arc is attained.

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Bibliographische Detailangaben
Veröffentlicht in:Proceedings of the IRE 1950-08, Vol.38 (8), p.886-889
1. Verfasser: Bond, W.L.
Format: Artikel
Sprache:eng
Schlagworte:
Bonding
Etching
Filters
Fluctuations
Goniometers
Instruments
Position measurement
Reflection
Senior members
Temperature
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Beschreibung
Zusammenfassung:An X-ray goniometer is turned into a double-crystal goniometer for use on precision cut AT quartz plates. Errors due to temperature change and to X-ray refraction are discussed. Precision of about one-tenth of a minute of arc is attained.
ISSN:0096-8390
2162-6634
DOI:10.1109/JRPROC.1950.234430