Feedback-Induced Failure of High-Power Diode Lasers

Feedback-Induced Failure of High-Power Diode Lasers

Catastrophic failure of diode pumps in laser systems exhibiting back-irradiance is a common occurrence yet poorly understood. Prior paper has established boundaries for time-zero failures, but these results cannot be used to deduce safe back-irradiance levels for long-term reliable operation. In thi...

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Veröffentlicht in:IEEE journal of quantum electronics 2018-12, Vol.54 (6), p.1-13
Hauptverfasser: Leisher, Paul O., Chen Li, Jha, Aman Kumar, Pipe, Kevin P., Helmrich, Jason D., Thiagarajan, Prabhu, Boisselle, Matthew C., Patra, Susant K., Sezgin, Sezer, Deri, Robert J.
Format: Artikel
Sprache:eng
Schlagworte:
Catastrophic events
COD
Diode lasers
Diode pumps
Failure
Failure analysis
Irradiance
Laser beams
Laser excitation
Laser feedback
Optical feedback
Pump lasers
Reliability
Semiconductor lasers
thermoreflectance imaging
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Beschreibung
Zusammenfassung:Catastrophic failure of diode pumps in laser systems exhibiting back-irradiance is a common occurrence yet poorly understood. Prior paper has established boundaries for time-zero failures, but these results cannot be used to deduce safe back-irradiance levels for long-term reliable operation. In this paper, a framework to describe the impact of back-irradiance on the reliability of diode pumps is established. The root-cause of back-irradiance induced failure is identified as thermal in nature. The approach follows conventional reliability methodologies by treating the parameters of back-irradiance as stressors, which accelerate failures.
ISSN:0018-9197
1558-1713
DOI:10.1109/JQE.2018.2873073