Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking
Presents a prolog to the article, "Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking".
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| Veröffentlicht in: | Proceedings of the IEEE 2013-12, Vol.101 (12), p.2495-2497 |
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| container_end_page | 2497 |
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| container_issue | 12 |
| container_start_page | 2495 |
| container_title | Proceedings of the IEEE |
| container_volume | 101 |
| creator | Esch, Jim |
| description | Presents a prolog to the article, "Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking". |
| doi_str_mv | 10.1109/JPROC.2013.2286655 |
| format | Article |
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| identifier | ISSN: 0018-9219 |
| ispartof | Proceedings of the IEEE, 2013-12, Vol.101 (12), p.2495-2497 |
| issn | 0018-9219 1558-2256 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Adders Benchmark testing CMOS technology Integrated circuits Nanoelectronics Power dissipation Semiconductor devices Special issues and sections Throughput |
| title | Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking |
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