Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking

Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking

Presents a prolog to the article, "Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking".

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Bibliographische Detailangaben
Veröffentlicht in:Proceedings of the IEEE 2013-12, Vol.101 (12), p.2495-2497
1. Verfasser: Esch, Jim
Format: Artikel
Sprache:eng
Schlagworte:
Adders
Benchmark testing
CMOS technology
Integrated circuits
Nanoelectronics
Power dissipation
Semiconductor devices
Special issues and sections
Throughput
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Beschreibung
Zusammenfassung:Presents a prolog to the article, "Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking".
ISSN:0018-9219
1558-2256
DOI:10.1109/JPROC.2013.2286655