Mapping the Local Photoelectronic Properties of Polycrystalline Solar Cells Through High Resolution Laser-Beam-Induced Current Microscopy

Mapping the Local Photoelectronic Properties of Polycrystalline Solar Cells Through High Resolution Laser-Beam-Induced Current Microscopy

To boost the efficiency of thin-film polycrystalline solar cells that are microscopically inhomogeneous, it is imperative to understand how the grain interiors (GIs) and grain boundaries (GBs) within these materials affect its overall electronic properties. By using an apertured near-field scanning...

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Veröffentlicht in:IEEE journal of photovoltaics 2014-01, Vol.4 (1), p.311-316
Hauptverfasser: Leite, Marina S., Abashin, Maxim, Lezec, Henri J., Gianfrancesco, Anthony G., Talin, A. Alec, Zhitenev, Nikolai B.
Format: Artikel
Sprache:eng
Schlagworte:
Cadmium compounds
Current measurement
grain boundaries (GBs)
Microscopy
Photoconductivity
photovoltaic (PV) cells
Photovoltaic cells
Probes
scanning probe microscopy
Surface topography
thin-film devices
wavelength measurement
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Beschreibung
Zusammenfassung:To boost the efficiency of thin-film polycrystalline solar cells that are microscopically inhomogeneous, it is imperative to understand how the grain interiors (GIs) and grain boundaries (GBs) within these materials affect its overall electronic properties. By using an apertured near-field scanning optical microscope in an illumination mode, we determined the local photocurrent that is generated within the GIs and at the GBs with nanoscale resolution and correlate the results with surface morphology and composition.
ISSN:2156-3381
2156-3403
DOI:10.1109/JPHOTOV.2013.2284860