Time-Domain Characterization of Photonic Integrated Filters Subject to Fabrication Variations

Fabrication variations are a key factor to degrade the performance of photonic integrated circuits (PICs), and especially wavelength filters. We propose an efficient modeling approach to quantify the effects of fabrication variations on the time-domain performance of linear passive photonic integrat...

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Veröffentlicht in:Journal of lightwave technology 2019-11, Vol.37 (21), p.5561-5570
Hauptverfasser: Ye, Yinghao, Wang, Mi, Spina, Domenico, Bogaerts, Wim, Dhaene, Tom
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container_end_page 5570
container_issue 21
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container_title Journal of lightwave technology
container_volume 37
creator Ye, Yinghao
Wang, Mi
Spina, Domenico
Bogaerts, Wim
Dhaene, Tom
description Fabrication variations are a key factor to degrade the performance of photonic integrated circuits (PICs), and especially wavelength filters. We propose an efficient modeling approach to quantify the effects of fabrication variations on the time-domain performance of linear passive photonic integrated circuits (including the wavelength filters) in the design stage, before fabrication. In particular, this novel approach conjugates the accuracy of the Polynomial Chaos (PC) expansion in describing stochastic variations and the efficiency of a Vector Fitting (VF)-based baseband modeling technique in performing time-domain simulations. A suitable example validates the performance of the proposed method.
doi_str_mv 10.1109/JLT.2019.2933311
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source IEEE Electronic Library (IEL)
subjects Baseband
Circuit design
Computational modeling
Computer simulation
Fabrication variations
Integrated circuit modeling
Integrated circuits
Modelling
Performance degradation
photonic integrated circuits
Photonics
polynomial Chaos
Polynomials
Random variables
Stochastic processes
Time domain analysis
time-domain variability analysis
Wave filters
title Time-Domain Characterization of Photonic Integrated Filters Subject to Fabrication Variations
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