A high-performance CMOS/SOS device with a gradually doped source-Drain extension structure

A gradually doped source-drain extension (GDDE) CMOS/SOS structure with n+ poly gate has been used to fabricate a high-performance CMOS/SOS inverter ring oscillator and 1%8 static binary counter. The 0.8-µm gate ring oscillator shows 80-ps stage delay at V_{DD} = 5 V, and it achieves 0.1 pJ of speed...

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Veröffentlicht in:IEEE electron device letters 1983-10, Vol.4 (10), p.372-374
Hauptverfasser: Chen, M.-L., Leung, B.C., Lalevic, B.
Format: Artikel
Sprache:eng
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Zusammenfassung:A gradually doped source-drain extension (GDDE) CMOS/SOS structure with n+ poly gate has been used to fabricate a high-performance CMOS/SOS inverter ring oscillator and 1%8 static binary counter. The 0.8-µm gate ring oscillator shows 80-ps stage delay at V_{DD} = 5 V, and it achieves 0.1 pJ of speed-power product with 95-ps stage delay. The plasma-etched epi island minimizes the edge leakage current, as shown in subthreshold characteristics.
ISSN:0741-3106
1558-0563
DOI:10.1109/EDL.1983.25768