A high-performance CMOS/SOS device with a gradually doped source-Drain extension structure
A gradually doped source-drain extension (GDDE) CMOS/SOS structure with n+ poly gate has been used to fabricate a high-performance CMOS/SOS inverter ring oscillator and 1%8 static binary counter. The 0.8-µm gate ring oscillator shows 80-ps stage delay at V_{DD} = 5 V, and it achieves 0.1 pJ of speed...
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Veröffentlicht in: | IEEE electron device letters 1983-10, Vol.4 (10), p.372-374 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A gradually doped source-drain extension (GDDE) CMOS/SOS structure with n+ poly gate has been used to fabricate a high-performance CMOS/SOS inverter ring oscillator and 1%8 static binary counter. The 0.8-µm gate ring oscillator shows 80-ps stage delay at V_{DD} = 5 V, and it achieves 0.1 pJ of speed-power product with 95-ps stage delay. The plasma-etched epi island minimizes the edge leakage current, as shown in subthreshold characteristics. |
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ISSN: | 0741-3106 1558-0563 |
DOI: | 10.1109/EDL.1983.25768 |