A 23-ns 1-Mb BiCMOS DRAM

A 1-Mb BiCMOS DRAM having a 23-ns access time is described. The DRAM uses a direct sensing technique and a nonaddress-multiplexing configuration. This technique combines the NMOS differential circuit on each pair of data lines with a common highly sensitive bipolar circuit. The resulting chip has be...

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Veröffentlicht in:IEEE journal of solid-state circuits 1990-10, Vol.25 (5), p.1102-1111
Hauptverfasser: Kitsukawa, G., Yanagisawa, K., Kobayashi, Y., Kinoshita, Y., Ohta, T., Udagawa, T., Miwa, H., Miyazawa, H., Kawajiri, Y., Ouchi, Y., Tsukada, H., Matsumoto, T., Itoh, K.
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container_end_page 1111
container_issue 5
container_start_page 1102
container_title IEEE journal of solid-state circuits
container_volume 25
creator Kitsukawa, G.
Yanagisawa, K.
Kobayashi, Y.
Kinoshita, Y.
Ohta, T.
Udagawa, T.
Miwa, H.
Miyazawa, H.
Kawajiri, Y.
Ouchi, Y.
Tsukada, H.
Matsumoto, T.
Itoh, K.
description A 1-Mb BiCMOS DRAM having a 23-ns access time is described. The DRAM uses a direct sensing technique and a nonaddress-multiplexing configuration. This technique combines the NMOS differential circuit on each pair of data lines with a common highly sensitive bipolar circuit. The resulting chip has been verified to have high-speed characteristics while maintaining a wide operating margin and a relatively small chip size of 62.2 mm/sup 2/, in spite of a 1.3- mu m lithography level.< >
doi_str_mv 10.1109/4.62130
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_4_62130</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>62130</ieee_id><sourcerecordid>28178715</sourcerecordid><originalsourceid>FETCH-LOGICAL-c302t-26cfdfa239e771f68eaa11364ef38f8721f26b036ff013f88edeeca25be1185f3</originalsourceid><addsrcrecordid>eNpFz81LxDAQBfAgCtZVvOqtF_WUNZO0aXpc6ydsWfADvIU0OwOVbrs2uwf_e6td9DQ85seDx9gpiCmAyK-TqZagxB6LIE0Nh0y977NICDA8l0IcsqMQPoaYJAYidjaLpeJtiIGXVXxTF-XiJb59npXH7IBcE_Bkdyfs7f7utXjk88XDUzGbc6-E3HCpPS3JSZVjlgFpg84BKJ0gKUMmk0BSV0JpIgGKjMEloncyrRDApKQm7HLsXffd5xbDxq7q4LFpXIvdNlhpIDMZpAO8GqHvuxB6JLvu65XrvywI-7PcJvZ3-SAvdpUueNdQ71pfh3-eG5lqUIM7H12NiH_vseMbiBpbHw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28178715</pqid></control><display><type>article</type><title>A 23-ns 1-Mb BiCMOS DRAM</title><source>IEEE Electronic Library (IEL)</source><creator>Kitsukawa, G. ; Yanagisawa, K. ; Kobayashi, Y. ; Kinoshita, Y. ; Ohta, T. ; Udagawa, T. ; Miwa, H. ; Miyazawa, H. ; Kawajiri, Y. ; Ouchi, Y. ; Tsukada, H. ; Matsumoto, T. ; Itoh, K.</creator><creatorcontrib>Kitsukawa, G. ; Yanagisawa, K. ; Kobayashi, Y. ; Kinoshita, Y. ; Ohta, T. ; Udagawa, T. ; Miwa, H. ; Miyazawa, H. ; Kawajiri, Y. ; Ouchi, Y. ; Tsukada, H. ; Matsumoto, T. ; Itoh, K.</creatorcontrib><description>A 1-Mb BiCMOS DRAM having a 23-ns access time is described. The DRAM uses a direct sensing technique and a nonaddress-multiplexing configuration. This technique combines the NMOS differential circuit on each pair of data lines with a common highly sensitive bipolar circuit. The resulting chip has been verified to have high-speed characteristics while maintaining a wide operating margin and a relatively small chip size of 62.2 mm/sup 2/, in spite of a 1.3- mu m lithography level.&lt; &gt;</description><identifier>ISSN: 0018-9200</identifier><identifier>EISSN: 1558-173X</identifier><identifier>DOI: 10.1109/4.62130</identifier><identifier>CODEN: IJSCBC</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Application software ; Applied sciences ; BiCMOS integrated circuits ; Driver circuits ; Electronics ; Exact sciences and technology ; Integrated circuits ; Integrated circuits by function (including memories and processors) ; Laboratories ; Lithography ; Microprocessors ; MOS devices ; Random access memory ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Timing</subject><ispartof>IEEE journal of solid-state circuits, 1990-10, Vol.25 (5), p.1102-1111</ispartof><rights>1991 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c302t-26cfdfa239e771f68eaa11364ef38f8721f26b036ff013f88edeeca25be1185f3</citedby><cites>FETCH-LOGICAL-c302t-26cfdfa239e771f68eaa11364ef38f8721f26b036ff013f88edeeca25be1185f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/62130$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/62130$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=19825613$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kitsukawa, G.</creatorcontrib><creatorcontrib>Yanagisawa, K.</creatorcontrib><creatorcontrib>Kobayashi, Y.</creatorcontrib><creatorcontrib>Kinoshita, Y.</creatorcontrib><creatorcontrib>Ohta, T.</creatorcontrib><creatorcontrib>Udagawa, T.</creatorcontrib><creatorcontrib>Miwa, H.</creatorcontrib><creatorcontrib>Miyazawa, H.</creatorcontrib><creatorcontrib>Kawajiri, Y.</creatorcontrib><creatorcontrib>Ouchi, Y.</creatorcontrib><creatorcontrib>Tsukada, H.</creatorcontrib><creatorcontrib>Matsumoto, T.</creatorcontrib><creatorcontrib>Itoh, K.</creatorcontrib><title>A 23-ns 1-Mb BiCMOS DRAM</title><title>IEEE journal of solid-state circuits</title><addtitle>JSSC</addtitle><description>A 1-Mb BiCMOS DRAM having a 23-ns access time is described. The DRAM uses a direct sensing technique and a nonaddress-multiplexing configuration. This technique combines the NMOS differential circuit on each pair of data lines with a common highly sensitive bipolar circuit. The resulting chip has been verified to have high-speed characteristics while maintaining a wide operating margin and a relatively small chip size of 62.2 mm/sup 2/, in spite of a 1.3- mu m lithography level.&lt; &gt;</description><subject>Application software</subject><subject>Applied sciences</subject><subject>BiCMOS integrated circuits</subject><subject>Driver circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Integrated circuits</subject><subject>Integrated circuits by function (including memories and processors)</subject><subject>Laboratories</subject><subject>Lithography</subject><subject>Microprocessors</subject><subject>MOS devices</subject><subject>Random access memory</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Timing</subject><issn>0018-9200</issn><issn>1558-173X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1990</creationdate><recordtype>article</recordtype><recordid>eNpFz81LxDAQBfAgCtZVvOqtF_WUNZO0aXpc6ydsWfADvIU0OwOVbrs2uwf_e6td9DQ85seDx9gpiCmAyK-TqZagxB6LIE0Nh0y977NICDA8l0IcsqMQPoaYJAYidjaLpeJtiIGXVXxTF-XiJb59npXH7IBcE_Bkdyfs7f7utXjk88XDUzGbc6-E3HCpPS3JSZVjlgFpg84BKJ0gKUMmk0BSV0JpIgGKjMEloncyrRDApKQm7HLsXffd5xbDxq7q4LFpXIvdNlhpIDMZpAO8GqHvuxB6JLvu65XrvywI-7PcJvZ3-SAvdpUueNdQ71pfh3-eG5lqUIM7H12NiH_vseMbiBpbHw</recordid><startdate>19901001</startdate><enddate>19901001</enddate><creator>Kitsukawa, G.</creator><creator>Yanagisawa, K.</creator><creator>Kobayashi, Y.</creator><creator>Kinoshita, Y.</creator><creator>Ohta, T.</creator><creator>Udagawa, T.</creator><creator>Miwa, H.</creator><creator>Miyazawa, H.</creator><creator>Kawajiri, Y.</creator><creator>Ouchi, Y.</creator><creator>Tsukada, H.</creator><creator>Matsumoto, T.</creator><creator>Itoh, K.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19901001</creationdate><title>A 23-ns 1-Mb BiCMOS DRAM</title><author>Kitsukawa, G. ; Yanagisawa, K. ; Kobayashi, Y. ; Kinoshita, Y. ; Ohta, T. ; Udagawa, T. ; Miwa, H. ; Miyazawa, H. ; Kawajiri, Y. ; Ouchi, Y. ; Tsukada, H. ; Matsumoto, T. ; Itoh, K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c302t-26cfdfa239e771f68eaa11364ef38f8721f26b036ff013f88edeeca25be1185f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1990</creationdate><topic>Application software</topic><topic>Applied sciences</topic><topic>BiCMOS integrated circuits</topic><topic>Driver circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Integrated circuits</topic><topic>Integrated circuits by function (including memories and processors)</topic><topic>Laboratories</topic><topic>Lithography</topic><topic>Microprocessors</topic><topic>MOS devices</topic><topic>Random access memory</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Timing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kitsukawa, G.</creatorcontrib><creatorcontrib>Yanagisawa, K.</creatorcontrib><creatorcontrib>Kobayashi, Y.</creatorcontrib><creatorcontrib>Kinoshita, Y.</creatorcontrib><creatorcontrib>Ohta, T.</creatorcontrib><creatorcontrib>Udagawa, T.</creatorcontrib><creatorcontrib>Miwa, H.</creatorcontrib><creatorcontrib>Miyazawa, H.</creatorcontrib><creatorcontrib>Kawajiri, Y.</creatorcontrib><creatorcontrib>Ouchi, Y.</creatorcontrib><creatorcontrib>Tsukada, H.</creatorcontrib><creatorcontrib>Matsumoto, T.</creatorcontrib><creatorcontrib>Itoh, K.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE journal of solid-state circuits</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kitsukawa, G.</au><au>Yanagisawa, K.</au><au>Kobayashi, Y.</au><au>Kinoshita, Y.</au><au>Ohta, T.</au><au>Udagawa, T.</au><au>Miwa, H.</au><au>Miyazawa, H.</au><au>Kawajiri, Y.</au><au>Ouchi, Y.</au><au>Tsukada, H.</au><au>Matsumoto, T.</au><au>Itoh, K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A 23-ns 1-Mb BiCMOS DRAM</atitle><jtitle>IEEE journal of solid-state circuits</jtitle><stitle>JSSC</stitle><date>1990-10-01</date><risdate>1990</risdate><volume>25</volume><issue>5</issue><spage>1102</spage><epage>1111</epage><pages>1102-1111</pages><issn>0018-9200</issn><eissn>1558-173X</eissn><coden>IJSCBC</coden><abstract>A 1-Mb BiCMOS DRAM having a 23-ns access time is described. The DRAM uses a direct sensing technique and a nonaddress-multiplexing configuration. This technique combines the NMOS differential circuit on each pair of data lines with a common highly sensitive bipolar circuit. The resulting chip has been verified to have high-speed characteristics while maintaining a wide operating margin and a relatively small chip size of 62.2 mm/sup 2/, in spite of a 1.3- mu m lithography level.&lt; &gt;</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/4.62130</doi><tpages>10</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9200
ispartof IEEE journal of solid-state circuits, 1990-10, Vol.25 (5), p.1102-1111
issn 0018-9200
1558-173X
language eng
recordid cdi_crossref_primary_10_1109_4_62130
source IEEE Electronic Library (IEL)
subjects Application software
Applied sciences
BiCMOS integrated circuits
Driver circuits
Electronics
Exact sciences and technology
Integrated circuits
Integrated circuits by function (including memories and processors)
Laboratories
Lithography
Microprocessors
MOS devices
Random access memory
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Timing
title A 23-ns 1-Mb BiCMOS DRAM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T12%3A35%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%2023-ns%201-Mb%20BiCMOS%20DRAM&rft.jtitle=IEEE%20journal%20of%20solid-state%20circuits&rft.au=Kitsukawa,%20G.&rft.date=1990-10-01&rft.volume=25&rft.issue=5&rft.spage=1102&rft.epage=1111&rft.pages=1102-1111&rft.issn=0018-9200&rft.eissn=1558-173X&rft.coden=IJSCBC&rft_id=info:doi/10.1109/4.62130&rft_dat=%3Cproquest_RIE%3E28178715%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=28178715&rft_id=info:pmid/&rft_ieee_id=62130&rfr_iscdi=true