A multibit test trigger circuit for megabit SRAMs

A multibit test trigger circuit for megabit SRAMs

A multibit test (MBT) trigger circuit for megabit SRAM packages with no unused pins is discussed. The features of the MBT trigger circuit are a logic trigger mode without using any additional pins and practical use of counter circuits. The essence of trigger mode selection is that two pulses are for...

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Veröffentlicht in:IEEE journal of solid-state circuits 1990-02, Vol.25 (1), p.68-71
Hauptverfasser: Miyaji, F., Emori, T., Matsuyama, Y., Kanaishi, Y., Seno, K., Hagiwara, Y.
Format: Artikel
Sprache:eng
Schlagworte:
Circuit testing
Conductors
Counting circuits
Flip-flops
Logic circuits
Packaging
Pins
Random access memory
Research and development
Trigger circuits
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Zusammenfassung:A multibit test (MBT) trigger circuit for megabit SRAM packages with no unused pins is discussed. The features of the MBT trigger circuit are a logic trigger mode without using any additional pins and practical use of counter circuits. The essence of trigger mode selection is that two pulses are for MBT set and three pulses are for MBT reset. In this way, a logic trigger mode that does not use NC pins is especially effective as a 4-Mb SRAM. In addition, the proposed scheme is able to act as a logic trigger for an MBT circuit. The scheme is simple and effective. The logic trigger mode is proposed for future standardization.< >
ISSN:0018-9200
1558-173X
DOI:10.1109/4.50286