DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation

DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation

A self-learning algorithm called DYTEST, which uses a dynamic testability measure (DTM) to accelerate test generation, is presented. DYTEST's DTM guides the choice of a potential main sensitizing path during test generation. A full-logic value label backward implication creates estimates of log...

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Veröffentlicht in:IEEE transactions on computer-aided design of integrated circuits and systems 1990-08, Vol.9 (8), p.893-898
Hauptverfasser: Mao, W., Ciletti, M.D.
Format: Artikel
Sprache:eng
Schlagworte:
Algorithm design and analysis
Applied sciences
Automatic testing
Benchmark testing
Circuit faults
Circuit testing
Decision trees
Electronics
Exact sciences and technology
Heuristic algorithms
Integrated circuits
Integrated circuits by function (including memories and processors)
Life estimation
Logic testing
Observability
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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Zusammenfassung:A self-learning algorithm called DYTEST, which uses a dynamic testability measure (DTM) to accelerate test generation, is presented. DYTEST's DTM guides the choice of a potential main sensitizing path during test generation. A full-logic value label backward implication creates estimates of logic values for the primary inputs. Dependent and k-limited backtracks are used to further reduce the number of backtracks.< >
ISSN:0278-0070
1937-4151
DOI:10.1109/43.57782