Characterization of plasmas from a pulsed jet discharge for applications VUV spectroscopy and micromechanics

Plasmas from a pulsed jet discharge have been characterized with respect to gas species and nozzle design. Spectral lines from the gas used in the pulsed nozzle are apparent in the visible region. The vacuum ultraviolet spectrum, particularly for heavier gases, is dominated by emission from species...

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Veröffentlicht in:IEEE journal of quantum electronics 1991-01, Vol.27 (1), p.95-100
Hauptverfasser: Phillips, H., Kubodera, S., Sauerbrey, R., Tittel, F.K., Wisoff, P.J.
Format: Artikel
Sprache:eng
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Zusammenfassung:Plasmas from a pulsed jet discharge have been characterized with respect to gas species and nozzle design. Spectral lines from the gas used in the pulsed nozzle are apparent in the visible region. The vacuum ultraviolet spectrum, particularly for heavier gases, is dominated by emission from species sputtered from the nozzle. The production of highly ionized and excited states from materials created by the sputtering of the nozzle has possible applications in VUV (vacuum ultraviolet) spectroscopy. Operating the pulsed jet discharge at a 50-Hz repetition rate with NF/sub 3/ to produce excited fluorine ions allowed etch rates in excess of 10 mu m/min to be achieved in silicon; this may have applications to micromechanics.< >
ISSN:0018-9197
1558-1713
DOI:10.1109/3.73546