Circuit analysis of an ultrafast junction mixing scanning tunneling microscope

A lumped element circuit model for the operation of a junction mixing scanning tunneling microscope (JM-STM) is presented. Fits from this model show excellent agreement with experimental results in the picosecond time regime. The tip sample capacitance employed in the model was calculated to be 33 f...

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Veröffentlicht in:	IEEE journal of quantum electronics 1998-08, Vol.34 (8), p.1415-1418
Hauptverfasser:	Steeves, G.M., Elezzabi, A.Y., Teshima, R., Said, R.A., Freeman, M.R.
Format:	Artikel
Sprache:	eng
Schlagworte:	Capacitance Circuit analysis Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Optical microscopy Optical pulses Physics Scanning electron microscopy Scanning probe microscopes, components and techniques Scanning tunneling microscopes Spatial resolution Tunneling Ultrafast electronics Ultrafast optics
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Beschreibung
Zusammenfassung:	A lumped element circuit model for the operation of a junction mixing scanning tunneling microscope (JM-STM) is presented. Fits from this model show excellent agreement with experimental results in the picosecond time regime. The tip sample capacitance employed in the model was calculated to be 33 fF, using the method of images. By varying the capacitance, various tip/sample geometries can be investigated. Testing the response of the model tunnel junction, for faster electrical pulses, suggests how the JM-STM can be pushed into the femtosecond time regime.
ISSN:	0018-9197 1558-1713
DOI:	10.1109/3.704332