Temperature dependence of radiation damage and its annealing in silicon detectors

The radiation damage resulting from the large particle fluences predicted at the Superconducting Super Collider induces significant leakage currents in Si detectors. In order to limit these currents, the detectors are operated at reduced temperatures ( approximately 0 degrees C). Results are present...

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Veröffentlicht in:IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) 1993-08, Vol.40 (4), p.344-348
Hauptverfasser: Ziock, H.J., Boissevain, J.G., Holzscheiter, K., Kapustinsky, J.S., Palounek, A.P.T., Sondheim, W.E., Barberis, E., Cartiglia, N., Leslie, J., Pitzl, D., Rowe, W.A., Sadrozinski, H.F.-W., Seiden, A., Spencer, E., Wilder, M., Ellison, J.A., Fleming, J.K., Jerger, S., Joyce, D., Lietzke, C., Reed, E., Wimpenny, S.J., Ferguson, P., Frautschi, M.A., Matthews, J.A.J., Skinner, D.
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Sprache:eng
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Zusammenfassung:The radiation damage resulting from the large particle fluences predicted at the Superconducting Super Collider induces significant leakage currents in Si detectors. In order to limit these currents, the detectors are operated at reduced temperatures ( approximately 0 degrees C). Results are presented of a study of temperature effects on both the initial radiation damage and the long-term annealing of that damage in Si PIN detectors. Depletion voltage results are reported. The detectors are exposed to approximately 10/sup 14//cm/sup 2/ 650-MeV protons. Very pronounced temperature dependences are observed.< >
ISSN:0018-9499
1558-1578
DOI:10.1109/23.256577