Analysis of shielded lossy multilayered-substrate microstrip discontinuities
The spatial Green's function for a rectangular cavity partially filled with multiple layers of lossy dielectrics has been derived. The Green's function is used to compute the fields around a discontinuity in a transmission line. To analyze a discontinuity, the unknown surface current maint...
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| Veröffentlicht in: | IEEE transactions on microwave theory and techniques 2001-04, Vol.49 (4), p.701-711 |
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| container_title | IEEE transactions on microwave theory and techniques |
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| creator | Tony, E.S. Chaudhuri, S.K. |
| description | The spatial Green's function for a rectangular cavity partially filled with multiple layers of lossy dielectrics has been derived. The Green's function is used to compute the fields around a discontinuity in a transmission line. To analyze a discontinuity, the unknown surface current maintained on the microstrip discontinuity is expanded in terms of known suitable basis functions. The electric-field components in the plane of the discontinuity region are then written in terms of this current. Imposing the boundary condition that the component of the electric-field tangential to the metallization is zero yields the electric-field integral equation (EFIE). The method of moments is applied to the EFIE to obtain a system of linear equations. The resultant semianalytical expressions were used to conduct accurate modeling of a variety of structures. The validity and accuracy of this method are established through comparison with other published results. Convergence considerations are outlined and verified. |
| doi_str_mv | 10.1109/22.915445 |
| format | Article |
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The Green's function is used to compute the fields around a discontinuity in a transmission line. To analyze a discontinuity, the unknown surface current maintained on the microstrip discontinuity is expanded in terms of known suitable basis functions. The electric-field components in the plane of the discontinuity region are then written in terms of this current. Imposing the boundary condition that the component of the electric-field tangential to the metallization is zero yields the electric-field integral equation (EFIE). The method of moments is applied to the EFIE to obtain a system of linear equations. The resultant semianalytical expressions were used to conduct accurate modeling of a variety of structures. The validity and accuracy of this method are established through comparison with other published results. Convergence considerations are outlined and verified.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/22.915445</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Boundary conditions ; Convergence ; Dielectric losses ; Dielectrics ; Discontinuity ; Green's function methods ; Green's functions ; Holes ; Integral equations ; Metallization ; Microstrip ; Microwaves ; Moment methods ; Resultants ; Transmission line discontinuities ; Transmission lines</subject><ispartof>IEEE transactions on microwave theory and techniques, 2001-04, Vol.49 (4), p.701-711</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2001</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c460t-817d77ba6765964fa86e6aebe40e23123dc33b70f3eb410e108d0174a330dadb3</citedby><cites>FETCH-LOGICAL-c460t-817d77ba6765964fa86e6aebe40e23123dc33b70f3eb410e108d0174a330dadb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/915445$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/915445$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Tony, E.S.</creatorcontrib><creatorcontrib>Chaudhuri, S.K.</creatorcontrib><title>Analysis of shielded lossy multilayered-substrate microstrip discontinuities</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>The spatial Green's function for a rectangular cavity partially filled with multiple layers of lossy dielectrics has been derived. The Green's function is used to compute the fields around a discontinuity in a transmission line. To analyze a discontinuity, the unknown surface current maintained on the microstrip discontinuity is expanded in terms of known suitable basis functions. The electric-field components in the plane of the discontinuity region are then written in terms of this current. Imposing the boundary condition that the component of the electric-field tangential to the metallization is zero yields the electric-field integral equation (EFIE). The method of moments is applied to the EFIE to obtain a system of linear equations. The resultant semianalytical expressions were used to conduct accurate modeling of a variety of structures. The validity and accuracy of this method are established through comparison with other published results. Convergence considerations are outlined and verified.</description><subject>Boundary conditions</subject><subject>Convergence</subject><subject>Dielectric losses</subject><subject>Dielectrics</subject><subject>Discontinuity</subject><subject>Green's function methods</subject><subject>Green's functions</subject><subject>Holes</subject><subject>Integral equations</subject><subject>Metallization</subject><subject>Microstrip</subject><subject>Microwaves</subject><subject>Moment methods</subject><subject>Resultants</subject><subject>Transmission line discontinuities</subject><subject>Transmission lines</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqN0jtPwzAQB3ALgUR5DKxMEQOIIeX8jD1WFS-pEgvMkRNfhKs8SpwM-fYkSsXAQJls6376y6c7Qq4oLCkF88DY0lAphDwiCyplEhuVwDFZAFAdG6HhlJyFsB2fQoJekM2qtuUQfIiaIgqfHkuHLiqbEIao6svOl3bAFl0c-ix0re0wqnzeNuPd7yLnQ97Una9733kMF-SksGXAy_15Tj6eHt_XL_Hm7fl1vdrEuVDQxZomLkkyqxIljRKF1QqVxQwFIOOUcZdzniVQcMwEBaSgHdBEWM7BWZfxc3I35-7a5qvH0KXV-BEsS1tj04fUUKG4NpKN8vZPyYwApow4DLVmRo6xh6GYIuEwVFpoxc0_oDSG0amZm19w2_TtOL-Q6jELjNJT2v2MpiGFFot01_rKtkNKIZ1WJGUsnVdktNez9Yj44_bFb91EtUw</recordid><startdate>20010401</startdate><enddate>20010401</enddate><creator>Tony, E.S.</creator><creator>Chaudhuri, S.K.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>H8D</scope><scope>8BQ</scope><scope>JG9</scope><scope>7TB</scope><scope>FR3</scope><scope>F28</scope></search><sort><creationdate>20010401</creationdate><title>Analysis of shielded lossy multilayered-substrate microstrip discontinuities</title><author>Tony, E.S. ; Chaudhuri, S.K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c460t-817d77ba6765964fa86e6aebe40e23123dc33b70f3eb410e108d0174a330dadb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Boundary conditions</topic><topic>Convergence</topic><topic>Dielectric losses</topic><topic>Dielectrics</topic><topic>Discontinuity</topic><topic>Green's function methods</topic><topic>Green's functions</topic><topic>Holes</topic><topic>Integral equations</topic><topic>Metallization</topic><topic>Microstrip</topic><topic>Microwaves</topic><topic>Moment methods</topic><topic>Resultants</topic><topic>Transmission line discontinuities</topic><topic>Transmission lines</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tony, E.S.</creatorcontrib><creatorcontrib>Chaudhuri, S.K.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Aerospace Database</collection><collection>METADEX</collection><collection>Materials Research Database</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Engineering Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tony, E.S.</au><au>Chaudhuri, S.K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of shielded lossy multilayered-substrate microstrip discontinuities</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>2001-04-01</date><risdate>2001</risdate><volume>49</volume><issue>4</issue><spage>701</spage><epage>711</epage><pages>701-711</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>The spatial Green's function for a rectangular cavity partially filled with multiple layers of lossy dielectrics has been derived. The Green's function is used to compute the fields around a discontinuity in a transmission line. To analyze a discontinuity, the unknown surface current maintained on the microstrip discontinuity is expanded in terms of known suitable basis functions. The electric-field components in the plane of the discontinuity region are then written in terms of this current. Imposing the boundary condition that the component of the electric-field tangential to the metallization is zero yields the electric-field integral equation (EFIE). The method of moments is applied to the EFIE to obtain a system of linear equations. The resultant semianalytical expressions were used to conduct accurate modeling of a variety of structures. The validity and accuracy of this method are established through comparison with other published results. Convergence considerations are outlined and verified.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/22.915445</doi><tpages>11</tpages></addata></record> |
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| source | IEEE Electronic Library (IEL) |
| subjects | Boundary conditions Convergence Dielectric losses Dielectrics Discontinuity Green's function methods Green's functions Holes Integral equations Metallization Microstrip Microwaves Moment methods Resultants Transmission line discontinuities Transmission lines |
| title | Analysis of shielded lossy multilayered-substrate microstrip discontinuities |
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