Design and performance of a noncontacting probe for measurements on high-frequency planar circuits

Design and performance of a noncontacting probe for measurements on high-frequency planar circuits

Optimal design of a noncontacting magnetic probe for measurements on the interior of planar high-frequency circuits has been studied, and performance of the probe has been determined. The design was studied using enlarged models tested at frequencies 100 times lower than those of the actual intended...

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Veröffentlicht in:IEEE transactions on microwave theory and techniques 1992-08, Vol.40 (8), p.1701-1708
Hauptverfasser: Osofsky, S.S., Schwarz, S.E.
Format: Artikel
Sprache:eng
Schlagworte:
Circuit testing
Distributed parameter circuits
Frequency
Magnetic circuits
Phase measurement
Position measurement
Probes
Scattering parameters
Transmission line measurements
Transmission line theory
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Zusammenfassung:Optimal design of a noncontacting magnetic probe for measurements on the interior of planar high-frequency circuits has been studied, and performance of the probe has been determined. The design was studied using enlarged models tested at frequencies 100 times lower than those of the actual intended use. The nature of its errors has been investigated, and some techniques for error reduction have been found. The accuracy of measurements on circuits with SWR
ISSN:0018-9480
1557-9670
DOI:10.1109/22.149550