Electrostatic popping in AMR and GMR heads

Dielectric breakdown of insulating layers between the MRE (magneto resistive element) and the conducting shields generates another type of base line shift or popping noise in MR heads. Pulse shapes are similar to those of thermal asperities, but they can be bipolar and can occur without a disk. Meas...

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Veröffentlicht in:	IEEE transactions on magnetics 1999-09, Vol.35 (5), p.2583-2585
1. Verfasser:	Baker, B.R.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Dielectric breakdown Dielectrics and electrical insulation Electronics Electrostatics Exact sciences and technology Magnetic devices Magnetic heads Magnetic shielding Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.) domain-motion devices, etc Noise generators Noise shaping Pulse measurements Pulse shaping methods Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Shape
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Beschreibung
Zusammenfassung:	Dielectric breakdown of insulating layers between the MRE (magneto resistive element) and the conducting shields generates another type of base line shift or popping noise in MR heads. Pulse shapes are similar to those of thermal asperities, but they can be bipolar and can occur without a disk. Measurements illustrate the difficulties of characterizing these pulses. A physical model is proposed to explain the behavior, and a simple SPICE simulation shows similar pulse behavior.
ISSN:	0018-9464 1941-0069
DOI:	10.1109/20.800897